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IEEE 1149.1-2013 REDLINE

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Standard for Test Access Port and Boundary-Scan Architecture

Available format(s)

Hardcopy , PDF

Withdrawn date

21-03-2024

Language(s)

English

Published date

13-05-2013

€413.81
Excluding VAT

1. Overview
2. Normative references
3. Definitions, abbreviations, acronyms, and special
    terms
4. Test access port (TAP)
5. Test logic architecture
6. Test logic controllers
7. Instruction register
8. Instructions
9. Test data registers
10. Bypass register
11. Boundary-scan register
12. Device identification register
13. Electronic chip identification (ECID) register
14. Initialization data register
15. Initialization status register
16. TMP status register
17. Reset selection register
18. Conformance and documentation requirements
Annex A (informative) - Example implementation using
        level-sensitive design techniques
Annex B (normative) - Boundary Scan Description Language
        (BSDL)
Annex C (normative) - Procedural Description Language (PDL)
Annex D (informative) - Integrated examples of BSDL and PDL
Annex E (informative) - Example iApply execution flow

This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the components normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).

Committee
Test Technology
DevelopmentNote
Supersedes IEEE 1149.1B. (09/2001) Supersedes IEEE DRAFT 1149.1. (02/2005)
DocumentType
Standard
ISBN
978-0-7381-8263-6
Pages
444
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn
Supersedes

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