DSCC 19206A:2024
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, LINEAR, PRECISION, CMOS INPUT, RRIO, WIDE SUPPLY RANGE, AMPLIFIERS, MONOLITHIC SILICON
Published date
06-12-2024
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Revision
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| ProductNote |
This standard is also refers to JEDEC JS-001
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Current
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| Supersedes |
| JEDEC JEP157A:2022 | RECOMMENDED ESD-CDM TARGET LEVELS |
| JEDEC JESD 22-C101F : 2013 | Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components |
| MIL-HDBK-103 Revision Y:2006 | List of Standard Microcircuit Drawings |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JEP 155B:2018 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision M:2022 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
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