JEDEC JESD 22-C101F : 2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
Hardcopy , PDF
20-01-2023
English
01-10-2013
All packaged semiconductor components, thin film circuits, surface acoustic wave (SAW) components,
opto-electronic components, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard.
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