DSCC V62/23612:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
Published date
25-04-2023
Publisher
Sorry this product is not available in your region.
This drawing documents the general requirements of a high performance Ultra-Low-Noise JESD204B/C Dual-Loop clock jitter cleaner microcircuit, with an operating temperature range of -55C to +125C.
| DocumentType |
Standard
|
| ProductNote |
This standard refers to JEDEC PUB 95.
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| JEDEC JESD 22-C101F : 2013 | Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components |
| ANSI/ESDA/JEDEC JS-001:2017 | ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br> |
| JEDEC JEP 155B:2018 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.