MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON

Published date

25-04-2023

Publisher

This drawing documents the general requirements of a high performance Ultra-Low-Noise JESD204B/C Dual-Loop clock jitter cleaner microcircuit, with an operating temperature range of -55C to +125C.

DocumentType	Standard
ProductNote	This standard refers to JEDEC PUB 95.
PublisherName	Defense Supply Centre Columbus
Status	Current

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
JEDEC JESD 22-C101F : 2013	Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
ANSI/ESDA/JEDEC JS-001:2017	ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br>
JEDEC JEP 155B:2018	RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION

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DSCC V62/23612:2023

MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON

Abstract

General Product Information

Standards Referencing This Book

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