EN 132100:1996
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Sectional Specification: Fixed multilayer ceramic surface mounting capacitors - Assessment levels EZ and DZ
01-11-2004
13-08-1996
FOREWORD
1 GENERAL
1.1 Scope
1.2 Related documents
1.3 Information to be given in a detail specification
1.4 Terminology
1.5 Marking
2 PREFERRED RATINGS AND CHARACTERISTICS
2.1 Preferred climatic categories
2.2 Preferred values of ratings
3 QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Certified test records of released lots
3.4 Qualification approval
3.5 Quality conformance inspection
4 TEST AND MEASUREMENT PROCEDURES
4.1 Special preconditioning
4.2 Preliminary drying
4.3 Measuring conditions
4.4 Mounting
4.5 Visual examination and check of dimensions
4.6 Electrical tests
4.7 Variation of capacitance with temperature
4.8 Shear test
4.9 Substrate bending test
4.10 Resistance to soldering heat
4.11 Solderability
4.12 Rapid change of temperature
4.13 Climatic sequence
4.14 Damp heat, steady state
4.15 Endurance
4.16 Robustness of terminations
4.17 Component solvent resistance
4.18 Solvent resistance of the marking
4.19 Accelerated damp heat, steady state
ANNEX A1 LIST OF TESTS AND SAMPLING PLAN FOR QUALIFICATION
APPROVAL ASSESSMENT LEVEL EZ
ANNEX A2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A3 LIST OF TESTS FOR CONFORMANCE (PERIODIC)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL EZ
ANNEX B CAPACITANCE AGEING OF FIXED CAPACITORS OF
CERAMIC DIELECTRIC CLASS 2
ANNEX C1 LIST OF TESTS AND SAMPLING PLAN FOR
QUALIFICATION APPROVAL, ASSESSEMENT LEVEL DZ
ANNEX C2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C3 LIST OF TESTS FOR CONFORMANCE (PERIODIC) -
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL DZ
ANNEX D DESTRUCTIVE PHYSICAL ANALYSIS (DPA)FOREWORD
1 GENERAL
1.1 Scope
1.2 Related documents
1.3 Information to be given in a detail specification
1.4 Terminology
1.5 Marking
2 PREFERRED RATINGS AND CHARACTERISTICS
2.1 Preferred climatic categories
2.2 Preferred values of ratings
3 QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Certified test records of released lots
3.4 Qualification approval
3.5 Quality conformance inspection
4 TEST AND MEASUREMENT PROCEDURES
4.1 Special preconditioning
4.2 Preliminary drying
4.3 Measuring conditions
4.4 Mounting
4.5 Visual examination and check of dimensions
4.6 Electrical tests
4.7 Variation of capacitance with temperature
4.8 Shear test
4.9 Substrate bending test
4.10 Resistance to soldering heat
4.11 Solderability
4.12 Rapid change of temperature
4.13 Climatic sequence
4.14 Damp heat, steady state
4.15 Endurance
4.16 Robustness of terminations
4.17 Component solvent resistance
4.18 Solvent resistance of the marking
4.19 Accelerated damp heat, steady state
ANNEX A1 LIST OF TESTS AND SAMPLING PLAN FOR QUALIFICATION
APPROVAL ASSESSMENT LEVEL EZ
ANNEX A2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A3 LIST OF TESTS FOR CONFORMANCE (PERIODIC)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL EZ
ANNEX B CAPACITANCE AGEING OF FIXED CAPACITORS OF
CERAMIC DIELECTRIC CLASS 2
ANNEX C1 LIST OF TESTS AND SAMPLING PLAN FOR
QUALIFICATION APPROVAL, ASSESSEMENT LEVEL DZ
ANNEX C2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C3 LIST OF TESTS FOR CONFORMANCE (PERIODIC) -
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL DZ
ANNEX D DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
Applicable to fixed unencapsulated multilayer surface mounting capacitors of ceramic dielectric Classes 1 and 2 with rated voltage not exceeding 200 V.
| Committee |
CLC/TC 40XA
|
| DevelopmentNote |
SUPERSEDES CECC 32100
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| DIN EN 132100:1997-04 | Identical |
| BS EN 132100:1997 | Identical |
| NEN EN 132100 : 1996 | Identical |
| SN EN 132100 : 1996 | Identical |
| I.S. EN 132100:1998 | Identical |
| UNE-EN 132100:1996 | Identical |
| CEI CECC 32101-804 : 2002 | SPECIFICA DI DETTAGLIO: CONDENSATORI FISSI CERAMICI MULTISTRATO A MONTAGGIO SUPERFICIALE, CLASSE 1, SOTTOCLASSE 1B, TIPO CG, CATEGORIA CLIMATICA 55/125/56, LIVELLO EZ |
| CEI CECC 32101-805 : 2002 | DETAIL SPECIFICATION: FIXED MULTILAYER CERAMIC SURFACE MOUNTING CAPACITORS, CLASS 2, SUB-CLASSES 2C1 AND 2R1, CLIMATIC CATEGORY 55/125/56, ASSESSMENT LEVEL EZ, WITH FAILURE RATE LEVELS |
| EN 132102:1996 | Blank Detail Specification: Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ |
| I.S. EN 132102:1998 | FIXED MULTILAYER CERAMIC SURFACE MOUNTING CAPACITORS - ASSESSMENT LEVEL DZ (BLANK DETAIL SPECIFICATION) |
| EN 132101:1996 | Blank Detail Specification: Fixed multilayer ceramic surface mounting capacitors - Assessment level EZ |
| IEC 60384-10:1989 | Fixed capacitors for use in electronic equipment. Part 10: Sectional specification: Fixed multilayer ceramic chip capacitors |
| ISO 3:1973 | Preferred numbers Series of preferred numbers |
| EN 130000 : 93 AMD 10 | FIXED CAPACITORS |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60062:2016 | Marking codes for resistors and capacitors |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
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