PREN 15991 : DRAFT 2014

Superseded

Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View superseded by

TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV)

Available format(s):

Superseded date: 01-11-2015

Language(s):

Published date: 12-01-2013

Publisher: Comite Europeen de Normalisation

Pure ENs are not available for sale, please purchase a suitable national adoption

Table of Contents - (Show below) - (Hide below)

Foreword
1 Scope
2 Principle
3 Spectrometry
4 Apparatus
5 Reagents and auxiliary material
6 Sampling and sample preparation
7 Calibration
8 Procedure
9 Wavelength and working range
10 Calculation of the results and evaluation
11 Reporting of results
12 Precision
13 Test report
Annex A (informative) - Results of interlaboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible interferences and their elimination
Annex D (informative) - Information regarding the evaluation of the
        uncertainty of the mean value
Annex E (informative) - Commercial certified reference materials
Annex F (informative) - Information regarding the validation of an
        analytical method based on liquid standards at the example
        of SiC and graphite
Bibliography

Abstract - (Show below) - (Hide below)

Describes a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.

General Product Information - (Show below) - (Hide below)

Comment Closes On
Committee	TC 187
Document Type	Draft
ISBN
Pages
Published
Publisher	Comite Europeen de Normalisation
Status	Superseded
Superseded By	EN 15991:2015

National Adoptions - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
14/30283939 DC : 0	Identical
09/30187541 DC : 0	Identical

Standards Referencing This Book - (Show below) - (Hide below)

ISO 5022:1979	Shaped refractory products Sampling and acceptance testing
EN ISO 21068-1:2008	Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008)
ISO 5725-4:1994	Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method
ISO 21068-1:2008	Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 1: General information and sample preparation
ISO 5725-2:1994	Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
ISO 8656-1:1988	Refractory products Sampling of raw materials and unshaped products Part 1: Sampling scheme
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

Categories associated with this Standard - (Show below) - (Hide below)

Sub-Categories associated with this Standard - (Show below) - (Hide below)

Sorry this product is not available in your region.

Add To Cart