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EN 167000 : 1993 AMD 1 1997

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

GENERIC SPECIFICATION: PIEZOELECTRIC FILTERS

Superseded date

01-02-2001

Superseded by

EN 60368-1:2000/A1:2004

Published date

12-01-2013

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Cooperating organizations
National foreword
Foreword
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred ratings and characteristics
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Incorporated components
3.5 Manufacturer's approval
3.6 Approval procedures
3.7 Procedures for capability approval
3.8 Procedures for qualification approval
3.9 Test procedures
3.10 Screening requirements
3.11 Rework and repair work
3.12 Certified test records
3.13 Validity of release
3.14 Release for delivery
3.15 Unchecked parameters
Section 4 - Test and measurement procedures
4.1 General
4.2 Test and measurement conditions
4.2.1 Standard conditions for testing
4.2.2 Uncertainty of measurement
4.2.3 Precautions
4.2.4 Alternative test methods
4.3 Visual inspection
4.4 Dimensioning and gauging procedures
4.5 Electrical test procedures
4.5.1 General
4.5.2 Insertion attenuation
4.5.3 Insertion attenuation as a function of
        temperature
4.5.4 Insertion phase shift
4.5.5 Insertion phase shift as a function of
        temperature
4.5.6 Envelope delay time
4.5.7 Envelope delay time as a function of temperature
4.5.8 Return attenuation
4.5.9 Return attenuation as a function of temperature
4.5.10 Intermodulation distortion
4.6 Mechanical and environmental test procedures
4.6.1 Robustness of terminations
4.6.2 Sealing tests
4.6.3 Soldering (Solderability and resistance to
        solder heat)
4.6.4 Rapid change of temperature: severe shock by
        liquid immersion
4.6.5 Rapid change of temperature: with prescribed
        time of transition
4.6.6 Bump
4.6.7 Vibration
4.6.8 Shock
4.6.9 Free fall
4.6.10 Acceleration, steady state
4.6.11 Low air pressure
4.6.12 Dry heat
4.6.13 Damp heat, cyclic
4.6.14 Cold
4.6.15 Climatic sequence
4.6.16 Damp heat, steady state
4.6.17 Salt mist, cyclic
4.6.18 Immersion in cleaning solvents
4.6.19 Radiation hardness
4.7 Endurance test procedure
4.7.1 Ageing
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references

Defines test procedures and general requirements for piezoelectric filters of assessed quality using either capability or qualification- approval methods.

Committee
TC 49
DevelopmentNote
BS DRAFT 97/200499 DC
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Superseded
SupersededBy

Standards Relationship
BS EN 167000:1993 Similar to
DIN EN 167000 : 93 AMD 1 98 Identical
I.S. EN 167000:1993 AMD 1 1998 Identical
PN EN 167000 : 2002 Identical

EN 167101 : 1995 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BLANK DETAIL SPECIFICATION: PIEZOELECTRIC FILTERS (CAPABILITY APPROVAL)
BS EN 167101:1996 Harmonized system of quality assessment for electronic components. Blank detail specification:piezoelectric filters (Capability approval)
EN 167100 : 1995 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: PIEZOELECTRIC FILTERS (CAPABILITY APPROVAL)
BS EN 167100:1996 Harmonized system of quality assessment for electronic components. Section specification: piezoelectric filters (Capability approval)

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