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EN 171000:2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Generic specification: Filters using waveguide type dielectric resonators

Superseded date

01-12-2004

Superseded by

EN 61337-1:2004

Published date

07-08-2001

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1 General
  1.1 Scope
  1.2 Normative references
  1.3 Units, symbols and terminology
  1.4 Preferred ratings and characteristics
  1.5 Marking
  1.6 Order of precedence
2 Quality Assessment Procedures
  2.1 Primary stage of manufacture
  2.2 Structurally similar components
  2.3 Sub-contracting
  2.4 Incorporated components
  2.5 Manufacturers approval
  2.6 Approval procedures
  2.7 Procedures for Capability Approval
  2.8 Procedures for Qualification Approval
  2.9 Test procedures
  2.10 Screening requirements
  2.11 Rework and repair work
  2.12 Certified test records
  2.13 Validity of release
  2.14 Release for delivery
  2.15 Unchecked parameters
3 Test and measurement procedures
  3.1 General
  3.2 Test and measurement conditions
  3.3 Visual inspection
  3.4 Dimension and gauging procedure
  3.5 Electrical test procedures
  3.6 Mechanical and environmental test procedures

Applicable to filters using waveguide type dielectric resonators of assessed quality using either capability approval or qualification approval procedures.

Committee
CLC/SR 49
DevelopmentNote
Supersedes EN 61337-1-1. (10/2001)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
DIN EN 171000:2002-02 Identical
NEN EN 171000 : 2001 Identical
SN EN 171000 : 2001 Identical
NF EN 171000 : 2005 Identical
PN EN 171000 : 2002 Identical
BS EN 171000:2001 Identical
I.S. EN 171000:2001 Identical
UNE-EN 171000:2001 Identical
PNE-prEN 171000 Identical

CECC 00114-3 : 94 AMD 2 CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY
CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
CECC 00111 PT3 : 1991 AMD 4 CENELEC ELECTRONIC COMPONENTS COMMITTEE - RULE OF PROCEDURE 11 - SPECIFICATIONS - PART 3: REGULATIONS CECC SPECIFICATIONS FOR COMPONENTS GENERAL AND PROFESSIONAL (CIVIL AND MILITARY) USAGE (EXCLUDING DETAIL SPECIFICATIONS)
HD 323.2.13 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
EN 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
EN 100114-1 : 1996 RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION
CECC 00114-2 : 1994 RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS
EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
EN 60068-2-29:1993 Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
HD 323.2.58 : 200S1 TEST TD: SOLDERABILITY, RESISTANCE TO DISSOLUTION OF METALIZATION AND TO SOLDERING HEAT OF SURFACE MOUNTING DEVICES (SMD)

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