• EN 60689:2009

    Current The latest, up-to-date edition.

    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

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    Published date:  27-03-2009

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Overview
      3.1 General
      3.2 Applied frequency range
      3.3 Measurement method
      3.4 Load capacitance
      3.5 Recommended drive level
      3.6 Measurement conditions
      3.7 Measurement of frequency-temperature
          characteristics
      3.8 Load capacitance frequency characteristics
    4 Measurement methods
      4.1 Method A
          4.1.1 Vector network analyzer/vector impedance
                analyzer
          4.1.2 Block diagram
          4.1.3 Specifications for vector network
                 analyzer/vector impedance analyzer
          4.1.4 Test fixture
          4.1.5 Measurement of equivalent circuit
                constants
          4.1.6 Frequency pulling
      4.2 Method B
          4.2.1 General
          4.2.2 Block diagram
          4.2.3 Calibration
          4.2.4 Procedure
    5 Measurement conditions
      5.1 General
      5.2 Measurement conditions
      5.3 Measurement of the frequency-temperature
          dependence
          5.3.1 General
          5.3.2 Block diagram
          5.3.3 Determination of the turnover point and
                parabolic coefficient beta (standard
                reference method)
          5.3.4 Measurement of the frequency versus
                temperature characteristics (mass
                production method)
          5.3.5 Frequency C[L] curve
    6 Test and environmental examination
      6.1 Application of the definition of IEC 60122-1
      6.2 Magnetism - Influence of a magnetic field on the
          frequency
      6.3 Enclosure
      6.4 Measuring conditions and electric performance
          6.4.1 General
          6.4.2 Measurement conditions
          6.4.3 Standard values
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    IEC 60689:2008(E) applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. This second edition cancels and replaces the first edition published in 1980. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs from that of IEC 60444-1.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 49
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
    IECQ 001002-2:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
    IEC 60068-2-31:2008 Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
    IEC Q 01 : 5.0 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES
    Q C 001005 : 1995 REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER THE IECQ SYSTEM, INCLUDING ISO 900
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
    IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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