Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Published date

17-04-2003

Publisher

European Committee for Standards - Electrical

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Committee	CLC/TC 47X
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current

Standards	Relationship
NF EN 60749-36 : 2003	Identical
IEC 60749-36:2003	Identical
NBN EN 60749-36 : 2004	Identical
NEN EN IEC 60749-36 : 2003	Identical
I.S. EN 60749-36:2003	Identical
PN EN 60749-36 : 2005	Identical
SN EN 60749-36 : 2003	Identical
UNE-EN 60749-36:2004	Identical
BS EN 60749-36:2003	Identical
CEI EN 60749-36 : 2004	Identical
DIN EN 60749-36:2003-12	Identical
BS EN 60601-2-33:2002+A2:2008	Identical

EN 60068-2-7:1993

Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state

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EN 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory