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  • BS EN 60749-36:2003

    Current The latest, up-to-date edition.

    Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  19-06-2003

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    1 Scope
    2 Normative references
    3 Test apparatus
    4 Procedure
    5 Summary
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

    Scope - (Show below) - (Hide below)

    Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 01/208601 DC (07/2003) Supersedes BS EN 60749. (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
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