• EN 62047-6:2010

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

    Available format(s): 

    Superseded date:  08-02-2022

    Language(s): 

    Published date:  05-03-2010

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Test piece
    5 Testing method and test apparatus
    6 Endurances (test termination)
    7 Test report
    Annex A (informative) Technical background of
            this standard
    Annex B (informative) Test piece
    Annex C (informative) Displacement measurement
    Annex D (informative) Testing environment
    Annex E (informative) Number of test pieces
    Bibliography
    Annex ZA (normative) Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    IEC 62047-6:2009 specifies the method for axial tensile-tensile force fatigue testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 µm and 10 µm under constant force range or constant displacement range. Thin films are used as main structural materials for MEMS and micromachines. The main structural materials for MEMS, micromachines, etc., have special features, such as typical dimensions of a few microns, material fabrication by deposition, andtest piece fabrication by means of non-mechanical machining, including photolithography. This International Standard specifies the axial force fatigue testing methods for micro-sized smooth specimens, which enables a guarantee of accuracy corresponding to the special features. The tests are carried out at room temperatures, in air, with loading applied to the test piece along the longitudinal axis.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 47F
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62047-18:2013 Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
    CEI EN 62047-18 : 2014 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 18: BEND TESTING METHODS OF THIN FILM MATERIALS
    I.S. EN 62047-18:2013 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 18: BEND TESTING METHODS OF THIN FILM MATERIALS (IEC 62047-18:2013 (EQV))

    Standards Referencing This Book - (Show below) - (Hide below)

    ASTM E 466 : 2015 : REDLINE Standard Practice for Conducting Force Controlled Constant Amplitude Axial Fatigue Tests of Metallic Materials
    ISO 6892:1998 Metallic materials Tensile testing at ambient temperature
    IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
    EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
    ISO 1099:2017 Metallic materials — Fatigue testing — Axial force-controlled method
    ISO 12107:2012 Metallic materials — Fatigue testing — Statistical planning and analysis of data
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