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EN 62132-8:2012

Current

Current

The latest, up-to-date edition.

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

Published date

21-09-2012

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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
10 RF immunity acceptance level
Annex A (normative) - Field strength determination
Annex B (normative) - IC stripline descriptions
Annex C (informative) - Closed stripline geometrical
        limitations
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

Committee
CLC/TC 47X
DevelopmentNote
To be read in conjunction with EN 62132-1. (09/2012)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

I.S. EN 62132-1:2016 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
EN 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

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