EN IEC 63287-2:2023
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Published date
12-05-2023
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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| OVE EN IEC 63287-2:2024 11 01 | Identical |
| DS/EN IEC 63287-2:2023 | Identical |
| CEI EN IEC 63287-2:2023 | Identical |
| PN-EN IEC 63287-2:2024-01 | Identical |
| UNE-EN IEC 63287-2:2023 | Identical |
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