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EN ISO 14880-1:2016

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties (ISO 14880-1:2016)

Superseded date

19-07-2019

Superseded by

EN ISO 14880-1:2019

Published date

17-08-2016

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European foreword
Foreword
Introduction
1 Scope
2 Terms and definitions
3 Symbols and units of measure
4 Coordinate system
5 Properties of individual lenses
Annex A (informative) - Microlens arrays applications
        (1) - Telecommunications
Annex B (informative) - Microlens arrays applications
        (2) - Image sensor arrays
Annex C (informative) - Microlens arrays applications
        (3) - LCD projection panels
Annex D (informative) - Microlens arrays applications
        (4) - Wavefront sensors
Annex E (informative) - Microlens arrays applications
        (5) - stereo displays
Annex F (informative) - Microlens arrays applications
        (6) - 3D imaging and light-field cameras
Bibliography

ISO 14880-1:2016 defines terms for microlens arrays. It applies to microlens arrays which consist of arrays of very small lenses formed inside or on one or more surfaces of a common substrate and systems. The aim of ISO 14880-1:2016 is to improve the compatibility and interchangeability of lens arrays from different suppliers and to enhance the development of technology using microlens arrays.

Committee
CEN/TC 123
DocumentType
Standard
PublisherName
Comite Europeen de Normalisation
Status
Superseded
SupersededBy

14/30301120 DC : 0 BS EN 4677-001 - AEROSPACE SERIES - WELDED AND BRAZED ASSEMBLIES FOR AEROSPACE CONSTRUCTIONS - JOINTS OF METALLIC MATERIALS BY ELECTRON BEAM WELDING - PART 001: QUALITY OF WELDED ASSEMBLIES
17/30361562 DC : 0 BS EN 4677-001 - AEROSPACE SERIES - WELDED AND BRAZED ASSEMBLIES FOR AEROSPACE CONSTRUCTIONS - JOINTS OF METALLIC MATERIALS BY ELECTRON BEAM WELDING - PART 001: QUALITY OF WELDED ASSEMBLIES
VDI 5581:2011-11 Measurement procedures for quality control in precision moulding of aspherical, freeform and microoptics

ISO 15529:2010 Optics and photonics Optical transfer function Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

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