EN ISO 14880-2:2006
Current
The latest, up-to-date edition.
Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006)
06-12-2006
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Apparatus
5.1 General
5.2 Standard optical radiation source
5.3 Standard lens
5.4 Collimator
5.5 Beam reduction optical system
5.6 Aperture stop
6 Test principle
7 Measurement arrangement
7.1 Measurement arrangement for single microlenses
7.2 Measurement arrangement for microlens arrays
7.3 Geometrical alignment of the sample
7.4 Preparation
8 Procedure
9 Evaluation
10 Accuracy
11 Test report
Annex A (normative) Measurement requirements for test
methods for microlenses
Annex B (normative) Microlens test Methods 1 and 2 using
Mach-Zehnder interferometer systems
Annex C (normative) Microlens test Methods 3 and 4 using
a lateral shearing interferometer system
Annex D (normative) Microlens test Method 5 using a
Shack-Hartmann sensor system
Annex E (normative) Microlens array test Method 1 using a
Twyman-Green interferometer system
Annex F (normative) Measurement of uniformity of microlens
array determined by test Method 2
Bibliography
ISO 14880-2:2006 specifies methods for testing wavefront aberrations for microlenses within microlens arrays. It is applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.
| Committee |
CEN/TC 123
|
| DocumentType |
Standard
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| PN EN ISO 14880-2 : 2007 | Identical |
| SN EN ISO 14880-2:2008 | Identical |
| ISO 14880-2:2006 | Identical |
| NF EN ISO 14880-2 : 2007 | Identical |
| UNI EN ISO 14880-2 : 2007 | Identical |
| BS EN ISO 14880-2:2006 | Identical |
| NEN EN ISO 14880-2 : 2007 | Identical |
| NBN EN ISO 14880-2 : 2007 | Identical |
| I.S. EN ISO 14880-2:2006 | Identical |
| NS EN ISO 14880-2 : 1ED 2006 | Identical |
| UNE-EN ISO 14880-2:2007 | Identical |
| DIN EN ISO 14880-2:2007-03 | Identical |
| VDI 5581:2011-11 | Measurement procedures for quality control in precision moulding of aspherical, freeform and microoptics |
| ISO 10110-14:2007 | Optics and photonics Preparation of drawings for optical elements and systems Part 14: Wavefront deformation tolerance |
| ISO/TR 14999-3:2005 | Optics and photonics Interferometric measurement of optical elements and optical systems Part 3: Calibration and validation of interferometric test equipment and measurements |
| ISO 14880-1:2016 | Optics and photonics Microlens arrays Part 1: Vocabulary and general properties |
| ISO 15529:2010 | Optics and photonics Optical transfer function Principles of measurement of modulation transfer function (MTF) of sampled imaging systems |
| ISO/TR 14999-2:2005 | Optics and photonics Interferometric measurement of optical elements and optical systems Part 2: Measurement and evaluation techniques |
| ISO/TR 14999-1:2005 | Optics and photonics Interferometric measurement of optical elements and optical systems Part 1: Terms, definitions and fundamental relationships |
| ISO 15367-2:2005 | Lasers and laser-related equipment Test methods for determination of the shape of a laser beam wavefront Part 2: Shack-Hartmann sensors |
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