EN ISO 14880-4:2006
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)
31-12-2006
01-06-2006
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Coordinate system
5 Test methods
5.1 Pitch and surface modulation depth measurement
5.2 Physical thickness
5.3 Radius of curvature
5.4 Surface preparation of microlens array for measurement
6 Procedure
6.1 Measurement of pitch and surface modulation depth
(lens sag)
6.2 Measurement of physical thickness
6.3 Measurement of radius of curvature
7 Results and uncertainties
8 Test report
Annex A (normative) Measurement with a Fizeau interferometer
system
Annex B (informative) Uniformity of array spacing
Bibliography
ISO 14880-4:2006 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.
Committee |
CEN/TC 123
|
DocumentType |
Standard
|
PublisherName |
Comite Europeen de Normalisation
|
Status |
Withdrawn
|
Standards | Relationship |
DIN EN ISO 14880-4:2006-08 | Identical |
NS EN ISO 14880-4 : 1ED 2006 | Identical |
UNE-EN ISO 14880-4:2007 | Identical |
SN EN ISO 14880-4 : 2006 | Identical |
I.S. EN ISO 14880-4:2006 | Identical |
BS EN ISO 14880-4:2006 | Identical |
NBN EN ISO 14880-4 : 2006 | Identical |
PN EN ISO 14880-4 : 2006 | Identical |
ISO 14880-4:2006 | Identical |
NEN EN ISO 14880-4 : 2006 | Identical |
NF EN ISO 14880-4 : 2006 | Identical |
UNI EN ISO 14880-4 : 2006 | Identical |
VDI 5581:2011-11 | Measurement procedures for quality control in precision moulding of aspherical, freeform and microoptics |
ISO 14880-2:2006 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations |
ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
ISO 14880-1:2016 | Optics and photonics Microlens arrays Part 1: Vocabulary and general properties |
ISO/TR 14999-1:2005 | Optics and photonics Interferometric measurement of optical elements and optical systems Part 1: Terms, definitions and fundamental relationships |
ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
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