EN ISO 14880-4:2006
Current
The latest, up-to-date edition.
Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)
01-06-2006
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Coordinate system
5 Test methods
5.1 Pitch and surface modulation depth measurement
5.2 Physical thickness
5.3 Radius of curvature
5.4 Surface preparation of microlens array for measurement
6 Procedure
6.1 Measurement of pitch and surface modulation depth
(lens sag)
6.2 Measurement of physical thickness
6.3 Measurement of radius of curvature
7 Results and uncertainties
8 Test report
Annex A (normative) Measurement with a Fizeau interferometer
system
Annex B (informative) Uniformity of array spacing
Bibliography
ISO 14880-4:2006 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.
| Committee |
CEN/TC 123
|
| DocumentType |
Standard
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN ISO 14880-4:2006-08 | Identical |
| NS EN ISO 14880-4 : 1ED 2006 | Identical |
| UNE-EN ISO 14880-4:2007 | Identical |
| SN EN ISO 14880-4 : 2006 | Identical |
| I.S. EN ISO 14880-4:2006 | Identical |
| BS EN ISO 14880-4:2006 | Identical |
| NBN EN ISO 14880-4 : 2006 | Identical |
| PN EN ISO 14880-4 : 2006 | Identical |
| ISO 14880-4:2006 | Identical |
| NEN EN ISO 14880-4 : 2006 | Identical |
| NF EN ISO 14880-4 : 2006 | Identical |
| UNI EN ISO 14880-4 : 2006 | Identical |
| VDI 5581:2011-11 | Measurement procedures for quality control in precision moulding of aspherical, freeform and microoptics |
| ISO 14880-2:2006 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO 14880-1:2016 | Optics and photonics Microlens arrays Part 1: Vocabulary and general properties |
| ISO/TR 14999-1:2005 | Optics and photonics Interferometric measurement of optical elements and optical systems Part 1: Terms, definitions and fundamental relationships |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
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