EN ISO 17526:2003

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Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)

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Published date: 15-06-2003

Publisher: Comite Europeen de Normalisation

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Table of Contents - (Show below) - (Hide below)

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
  3.1 Modes of operation
  3.2 Operating conditions
  3.3 Lifetime related terms
  3.4 Types and classification
  3.5 Others
4 Symbols and abbreviated terms
  4.1 Symbols
  4.2 Abbreviated terms
5 Test methods
  5.1 General
  5.2 Selection of lasers for lifetime testing
  5.3 Lifetime test in APPC- and ACC-mode
  5.4 Lifetime test at APC-mode
  5.5 Lifetime tests at limited aperture
6 Evaluation and extrapolation
7 Test report
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography

Abstract - (Show below) - (Hide below)

ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers.It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.

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Committee	CEN/TC 123
Document Type	Standard
ISBN
Pages
Published
Publisher	Comite Europeen de Normalisation
Status	Current

National Adoptions - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
ISO 17526:2003	Identical
BS EN ISO 17526:2003	Identical
I.S. EN ISO 17526:2003	Identical
UNI EN ISO 17526 : 2003	Identical
NEN EN ISO 17526 : 2003	Identical
DIN EN ISO 17526:2003-10	Identical
NBN EN ISO 17526 : 2003	Identical
UNE-EN ISO 17526:2004	Identical
NS EN ISO 17526 : 1ED 2003	Identical
PN EN ISO 17526 : 2006	Identical
SN EN ISO 17526 : 2003	Identical
NF EN ISO 17526 : 2003	Identical

Standards Referencing This Book - (Show below) - (Hide below)

ISO 2859-4:2002	Sampling procedures for inspection by attributes Part 4: Procedures for assessment of declared quality levels
ISO 11554:2017	Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power, energy and temporal characteristics
ISO 2859-3:2005	Sampling procedures for inspection by attributes — Part 3: Skip-lot sampling procedures
ISO 11252:2013	Lasers and laser-related equipment — Laser device — Minimum requirements for documentation
IEC 60319:1999	Presentation and specification of reliability data for electronic components
ISO 16269-7:2001	Statistical interpretation of data — Part 7: Median — Estimation and confidence intervals
ISO 2859-2:1985	Sampling procedures for inspection by attributes — Part 2: Sampling plans indexed by limiting quality (LQ) for isolated lot inspection
ISO 2859-0:1995	Sampling procedures for inspection by attributes — Part 0: Introduction to the ISO 2859 attribute sampling system
EN ISO 11554:2017	Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics (ISO 11554:2017)
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
EN ISO 11145:2016	Optics and photonics - Lasers and laser-related equipment - Vocabulary and symbols (ISO 11145:2016)
ISO 11145:2016	Optics and photonics Lasers and laser-related equipment Vocabulary and symbols
IEC 61751:1998	Laser modules used for telecommunication - Reliability assessment
IEC 61040:1990	Power and energy measuring detectors, instruments and equipment for laser radiation

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