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FD T16 203 : 2011 FD

Current

Current

The latest, up-to-date edition.

NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS

Published date

12-01-2013

DevelopmentNote
Indice de classement: T16-203FD. FD T16 203 December 2011. (12/2011)
DocumentType
Miscellaneous Product
PublisherName
Association Francaise de Normalisation
Status
Current

Standards Relationship
ISO/TS 10798:2011 Identical

ISO/TS 80004-3:2010 Nanotechnologies Vocabulary Part 3: Carbon nano-objects
ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary

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