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  • ISO 22493:2014

    Current The latest, up-to-date edition.

    Microbeam analysis Scanning electron microscopy Vocabulary

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  09-04-2014

    Publisher:  International Organization for Standardization

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    Abstract - (Show below) - (Hide below)

    ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

    ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes ISO/DIS 22493. (04/2014)
    Document Type Standard
    Publisher International Organization for Standardization
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    15/30291643 DC : 0 BS ISO 18516 - SURFACE CHEMICAL ANALYSIS - DETERMINATION OF LATERAL RESOLUTION AND SHARPNESS IN BEAM BASED METHODS
    ISO/TR 19319:2013 Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
    ISO/TS 10798:2011 Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
    13/30290864 DC : 0 BS EN 16691 - WATER QUALITY - DETERMINATION OF POLYCYCLIC AROMATIC HYDROCARBONS (PAH) IN WHOLE WATER SAMPLES USING LIQUID SOLID EXTRACTION COMBINED WITH GAS CHROMATOGRAPHY MASS SPECTROMETRY (GC-MS)
    16/30319120 DC : 0 BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS
    ISO/TS 24597:2011 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
    DD ISO/TS 10798 : DRAFT JULY 2011 NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
    BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
    17/30328207 DC : DRAFT SEP 2017 BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS
    PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
    PD ISO/TR 19319:2013 Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
    ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
    ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary
    ISO/TS 10797:2012 Nanotechnologies Characterization of single-wall carbon nanotubes using transmission electron microscopy
    12/30245653 DC : 0 BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
    XP ISO/TS 24597 : 2011 XP MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS OF EVALUATING IMAGE SHARPNESS
    FD T16 203 : 2011 FD NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
    PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 10241:1992 International terminology standards Preparation and layout
    ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
    ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
    ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
    ISO 704:2009 Terminology work — Principles and methods
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