GEIA 4900 : 2001
Current
The latest, up-to-date edition.
USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS' SPECIFIED TEMPERATURE RANGES
Hardcopy , PDF
English
01-01-2001
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Scope
2 References
3 Terms and Definitions
4 Objectives
5 Using Devices Outside the Manufacturer's Specified
Temperature Ranges
Annex A - Device Parameter Re-characterization
Annex B - Stress Balancing
Annex C - Parameter Conformance Assessment
Annex D - Higher Assembly Level Testing
Describes processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. Applies to any designer or manufacturer of equipment intended to operate under conditions that require semiconductor devices to function in temperature ranges beyond those for which the devices are marketed.
| Committee |
APMC
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
Government Electronics & Information Technology Association
|
| Status |
Current
|
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| EIA 4899 : 2001 | STANDARD FOR PREPARING AN ELECTRONIC COMPONENTS MANAGEMENT PLAN |
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