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  • GEIA SSB 1.001 : 1999

    Current The latest, up-to-date edition.

    QUALIFICATION AND RELIABILITY MONITORS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1999

    Publisher:  Government Electronics & Information Technology Association

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Reference Documents
    3 Qualification Tests
    4 Monitoring Tests

    Abstract - (Show below) - (Hide below)

    Sets up the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.

    General Product Information - (Show below) - (Hide below)

    Committee SSTCG12
    Development Note Annex to GEIA SSB 1. (12/2005)
    Document Type Standard
    Publisher Government Electronics & Information Technology Association
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    GEIA SSB 1 : 2000 GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS
    DD IEC TS 62564-1 : DRAFT SEP 2011 PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS
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