I.S. EN 60444-8:2017
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
Hardcopy , PDF
English
01-01-2017
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NBN EN 60444-8 : 2003 | Identical |
| DIN EN 60444-8:2004-03 | Identical |
| NF EN 60444-8 : 2017 | Identical |
| EN 60444-8:2017 | Identical |
| BS EN 60444-8:2017 | Identical |
| DIN EN 60444-8:2017-11 | Equivalent |
| IEC 61837-1:2012 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC 61837-2:2011+AMD1:2014 CSV | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures |
| IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| IEC 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
| IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| IEC 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
| IEC 60444-7:2004 | Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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