I.S. EN 60749-17:2003
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
Hardcopy , PDF
31-05-2019
English
01-01-2003
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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FOREWORD
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary
Defines the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| DIN EN 60749-17:2003-09 | Identical |
| EN 60749-17:2003 | Identical |
| NF EN 60749-17 : 2003 | Identical |
| BS EN 60749-17:2003 | Identical |
| NBN EN 60749-17 : 2004 | Identical |
| SN EN 60749-17 : 2003 | Identical |
| IEC 60749-17:2003 | Identical |
| UNE-EN 60749-17:2003 | Identical |
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