I.S. EN 60749-2:2002
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE
Hardcopy , PDF
English
01-01-2002
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Deals with the testing of low air pressure on semiconductor devices.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60749-2:2002 | Identical |
| DIN EN 60749-2:2003-04 | Identical |
| NF EN 60749-2 : 2002 | Identical |
| UNE-EN 60749-2:2003 | Identical |
| NBN EN 60749-2 : 2003 | Identical |
| EN 60749-2:2002 | Identical |
| IEC 60749-2:2002 | Identical |
| IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
| EN 60068-2-13:1999 | Environmental testing - Part 2: Tests - Test M: Low air pressure |
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