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I.S. EN 62047-21:2014

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICROELECTROMECHANICAL DEVICES - PART 21: TEST METHOD FOR POISSON'S RATIO OF THIN FILM MEMS MATERIALS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2014

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


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€33.00
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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, symbols
  and designations
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (informative) - Measurement example
        of Poisson's ratio using type 1 test piece
Annex B (informative) - Analysis of test results
        obtained from a type 2 test piece
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 [mu]m.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
38
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 62047-21:2014 Identical

ASTM E 132 : 2017 : REDLINE Standard Test Method for Poisson’s Ratio at Room Temperature
IEC 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

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