I.S. EN 62595-1-1:2013
Current
The latest, up-to-date edition.
LCD BACKLIGHT UNIT - PART 1-1: GENERIC SPECIFICATION (IEC 62595-1-1:2013 (EQV))
Hardcopy , PDF
English
01-01-2013
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
FOREWORD
1 Scope
2 Normative references
3 Technical aspects
4 Quality assessment procedures
5 Test and measurement procedures
Annex A (informative) - Examples of BLU drawings
Annex B (informative) - Lot tolerance percentage defective
(LTPD) sampling plans
Annex ZA (normative) - Normative references to international
Publications with their corresponding
European publications
Specifies general procedures for quality assessment and gives general rules for the measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
DocumentType |
Standard
|
Pages |
28
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
EN 62595-1-1:2013 | Identical |
EN ISO 80000-1:2013 | Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011) |
IEC 61747-10-2:2014 | Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance |
EN 62595-2:2013 | LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit |
IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
IEC 62595-2:2012 | LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
ISO 80000-1:2009 | Quantities and units — Part 1: General |
EN 62595-1-2:2012 | LCD backlight unit - Part 1-2: Terminology and letter symbols |
IEC 62595-1-2:2016 | Display lighting unit - Part 1-2: Terminology and letter symbols |
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