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I.S. EN IEC 60749-26:2018

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

16-04-2018

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


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€70.00
Excluding VAT

National foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus and required equipment
5 Stress test equipment qualification and routine verification
6 Classification procedure
7 Failure criteria
8 Component classification
Annex A (informative) - HBM test method flow chart
Annex B (informative) - HBM test equipment parasitic properties
Annex C (informative) - Example of testing a product using
        Table 2, Table 3, or Table 2 with a two-pin HBM tester
Annex D (informative) - Examples of coupled non-supply pin pairs
Annex E (normative) - Cloned non-supply (I/O) pin sampling
        test method
Bibliography

Defines the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

DevelopmentNote
Supersedes I.S. EN 60749-26. (04/2018)
DocumentType
Standard
Pages
0
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
IEC 60749-26:2013 Identical

IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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