I.S. EN IEC 60749-26:2018
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
Hardcopy , PDF
English
16-04-2018
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
National foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus and required equipment
5 Stress test equipment qualification and routine verification
6 Classification procedure
7 Failure criteria
8 Component classification
Annex A (informative) - HBM test method flow chart
Annex B (informative) - HBM test equipment parasitic properties
Annex C (informative) - Example of testing a product using
Table 2, Table 3, or Table 2 with a two-pin HBM tester
Annex D (informative) - Examples of coupled non-supply pin pairs
Annex E (normative) - Cloned non-supply (I/O) pin sampling
test method
Bibliography
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