I.S. EN ISO 18452:2016
Current
The latest, up-to-date edition.
FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - DETERMINATION OF THICKNESS OF CERAMIC FILMS BY CONTACT-PROBE PROFILOMETER (ISO 18452:2005)
Hardcopy , PDF
English
01-01-2016
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National Foreword
European foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Principle of measurement
5 Test environment
6 Apparatus
7 Test pieces
8 Procedure
9 Calculation
10 Limits to step height
11 Test report
Annex A (informative) - Effect of amplification factor
and levelling error on measured layer thickness
Describes a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer.
| DevelopmentNote |
Supersedes I.S. EN 1071-1. (06/2016)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 18452:2005 | Identical |
| EN ISO 18452:2016 | Identical |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
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