IEC 60147-2K:1978
Withdrawn
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Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -Part 2: General principles of measuring methods
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English - French, Russian
01-01-1978
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.
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