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NEN EN 100012 : 1995

Current

Current

The latest, up-to-date edition.

BASIC SPECIFICATION - X-RAY INSPECTION OF ELECTRONIC COMPONENTS

Published date

12-01-2013

1 Definitions
1.1 Radiography
1.2 Radioscopy
1.3 Searchray Camera
2 Scope
3 Equipment and materials
4 Procedure
4.1 General
4.2 Mounting of components
4.3 Indicators for the spatial resolution
4.4 Indicators for the image contrast
4.5 Positioning of components
4.6 Radiation direction
4.7 Marking of documents
4.8 Information concerning radiographic
4.9 Information concerning radioscopy
4.10 Operating personnel
5 Interpretation of results
6 Reports and records
6.1 Reports of inspection
6.2 Presentation of radiographs
6.3 Retention of reports and inspection records
7 Examination and acceptance criteria

Describes the equipment and procedures to be used for the inspection of electronic components by means of radiography and radioscopy.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
DIN EN 100012:1995-09 Identical
BS EN 100012:1996 Identical
IEC 60147-2M:1980 Identical
EN 100012:1995 Identical
IEC 60147-2G:1975 Identical
IEC 60147-2B:1970 Identical
EN 100012 : 1995 Identical
I.S. EN 100012:1995 Identical
IEC 60147-2C:1970 Identical
IEC 60147-2K:1978 Identical
IEC 60147-2:1963 Identical
IEC 60147-2F:1974 Identical
IEC 60147-2J:1978 Identical

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