Measurement of photosensitive devices. Part 3: Methods of measurement of photoconductive cells for use in the visible spectrum

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Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

01-01-1970

Publisher

International Electrotechnical Committee

Gives series of definitions and describes measuring methods for luminous sensitivity, rise time and fall time, relative spectral sensitivity, temperature dependence, illumination resistance, illumination current, dark resistance and dark current.

Committee	TC 110
DevelopmentNote	Stability Date: 2024. (11/2012)
DocumentType	Standard
Pages	15
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NEN 10306-3 : 1974	Identical

BS CECC 20000:1983

Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

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IEC 60306-3:1970

Measurement of photosensitive devices. Part 3: Methods of measurement of photoconductive cells for use in the visible spectrum

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