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  • BS CECC 20000:1983

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

    Available format(s):  Hardcopy, PDF

    Superseded date:  15-09-1996

    Language(s):  English

    Published date:  30-06-1983

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Inactive for the new design. Superseded by BS EN 120000 but remains current. (08/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units
    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    BS 9300:1969 Specification for semiconductor devices of assessed quality: generic data and methods of test
    BS 2011-2.1B:1977 Environmental testing. Tests Tests B. Dry Heat
    BS 9000-2(1996) : 1996 GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
    BS 1991(1967) : LATEST
    BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
    IEC 60306-4:1971 Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers
    BS 4727-4:GRP01(1971) : 1971 GLOSSARY OF ELECTROTECHNICAL POWER TELECOMMUNICATION ELECTRONICS LIGHTING & COLOUR TERMS - TERMS PARTICULAR TO LIGHTING & COLOUR - RADIATION AND PHOTOMETRY
    BS 2011-2.1Da:1977 Environmental testing. Tests Test Da. Accelerated damp heat
    BS 2011-2.1Z/AD:1977 Environmental testing. Tests Tests Z/AD. Composite temperature/humidity cyclic test
    BS 2011-2.1N:1985 Environmental testing. Tests Test N. Change of temperature
    BS 2045:1965 Preferred numbers
    BS 2011-2.1Ca:1977 Environmental testing. Tests Test Ca. Damp heat, steady state
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    IEC 60306-2:1969 Measurement of photosensitive devices. Part 2: Methods of measurement of phototubes
    ISO 2015:1976 Numbering of weeks
    IEC 60306-3:1970 Measurement of photosensitive devices. Part 3: Methods of measurement of photoconductive cells for use in the visible spectrum
    BS 3934:1965 Specification for dimensions of semiconductor devices and integrated electronic circuits
    BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
    BS 2011-2.1T:1981 Environmental testing. Tests Test T. Soldering
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