IEC 60679-4:1997
Current
The latest, up-to-date edition.
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
28-11-1997
IEC 60679-4:1997 applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification, IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.
Committee |
TC 49
|
DevelopmentNote |
Also numbered as BS EN 60679-4. (12/2005) Stability Date: 2017. (09/2017)
|
DocumentType |
Standard
|
Pages |
59
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
DIN EN 60679-4:1998-11 | Similar to |
NEN EN IEC 60679-4 : 1998 | Identical |
PN EN 60679-4 : 2003 | Identical |
UNE-EN 60679-4:1998 | Identical |
EN 60679-4:1998 | Identical |
NF EN 60679-4 : 1999 | Identical |
IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods |
15/30325282 DC : 0 | BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
05/30132097 DC : DRAFT JUNE 2005 | IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
EN 60679-3:2013 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
14/30282293 DC : 0 | BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
09/30198258 DC : 0 | BS EN 60679-3 ED.3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
I.S. EN 60679-3:2013 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS (IEC 60679-3:2012 (EQV)) |
BS EN 60679-3:2013 | Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections |
11/30243576 DC : DRAFT FEB 2011 | BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 60679-3 : 2014 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
EN IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods |
IEC 60679-4-1:1998 | Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval |
IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
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