• IEC 61178-1:1993

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  09-08-2002

    Language(s):  English - French

    Published date:  31-03-1993

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 General
        1.1 Scope
        1.2 Normative references
    2 Technical
        2.1 Order of precedence
        2.2 Units, symbols and terminology
        2.3 Preferred ratings and characteristics
        2.4 Marking
    3 Quality assessment procedures
        3.1 Primary stage of manufacture
        3.2 Structurally similar components
        3.3 Subcontracting
        3.4 Manufacturer's approval
        3.5 Approval procedures
        3.6 Procedures for capability approval
        3.7 Procedures for qualification approval
        3.8 Test procedures
        3.9 Screening requirements
        3.10 Rework and repair work
        3.11 Certified test records
        3.12 Delayed delivery
        3.13 Release for delivery
        3.14 Unchecked parameters
    4 Test and measurement procedures
        4.1 General
        4.2 Alternative test methods
        4.3 Precision of measurement
        4.4 Standard conditions for testing
        4.5 Visual inspection
        4.6 Dimensioning and gauging procedures
        4.7 Electrical test procedures
              4.7.1 Frequency and resonance resistance
              4.7.2 Drive level dependency
              4.7.3 Frequency and resonance resistance as
                      a function of temperature
              4.7.4 Unwanted responses
              4.7.5 Shunt capacitance
              4.7.6 Load resonance frequency and resistance
              4.7.7 Frequency pulling range (fL1.L2)
              4.7.8 Motional parameters
              4.7.9 Insulation resistance
        4.8 Mechanical and environmental test procedures
              4.8.1 Robustness of terminations (destructive)
              4.8.2 Sealing tests (non destructive)
              4.8.3 Soldering (solderability and resistance to
                      soldering heat)
              4.8.4 Rapid change of temperature, two-fluid bath
                      method (non destructive)
              4.8.5 Rapid change of temperature with prescribed
                      time of transition (non destructive)
              4.8.6 Bump (destructive)
              4.8.7 Vibration (destructive)
              4.8.8 Shock (destructive)
              4.8.9 Free fall (destructive)
              4.8.10 Acceleration, steady state (non destructive)
              4.8.11 Dry heat (non destructive)
              4.8.12 Damp heat, cyclic (destructive)
              4.8.13 Cold (non destructive)
              4.8.14 Climatic sequence (destructive)
              4.8.15 Dampheat, steady state (destructive)
        4.9 Endurance test procedure
              4.9.1 Ageing (non destructive)
              4.9.2 Extended ageing (non destructive)

    Abstract - (Show below) - (Hide below)

    Specifies the methods of test and general requirements for quartzcrystal units of assessed quality using either capability approvalor qualification approval procedures according to clause 11 of IECQ001002.

    General Product Information - (Show below) - (Hide below)

    Committee TC 49
    Development Note Supersedes IEC 122 PT1 (03/2001)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    CEI EN 60368-4 : 2003 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 4: SECTIONAL SPECIFICATION - CAPABILITY APPROVAL
    05/30132097 DC : DRAFT JUNE 2005 IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. HD 60027-2:2003 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
    I.S. EN 60368-1:2000 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS EN 60368-4:2001 Piezoelectric filters Sectional specification. Capability approval
    13/30278807 DC : 0 BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
    BS EN 60368-1:2000 Piezoelectric filters Generic specification
    CEI EN 60368-1 : 2006 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 61178-3-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
    IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
    IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
    HD 60027-2 : 200S1 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    IEC 61178-2-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
    IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
    BS EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
    NFC 03 002 : 2002 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    IEC 60368-4:2000 Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
    EN 60679-4 : 1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - SECTIONAL SPECIFICATION - CAPABILITY APPROVAL
    EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    EN 60368-4 : 2000 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 4: SECTIONAL SPECIFICATION - CAPABILITY APPROVAL

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
    IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
    IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC GUIDE 102:1996 Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
    IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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