IEC 61178-1:1993

FOREWORD
1 General
    1.1 Scope
    1.2 Normative references
2 Technical
    2.1 Order of precedence
    2.2 Units, symbols and terminology
    2.3 Preferred ratings and characteristics
    2.4 Marking
3 Quality assessment procedures
    3.1 Primary stage of manufacture
    3.2 Structurally similar components
    3.3 Subcontracting
    3.4 Manufacturer's approval
    3.5 Approval procedures
    3.6 Procedures for capability approval
    3.7 Procedures for qualification approval
    3.8 Test procedures
    3.9 Screening requirements
    3.10 Rework and repair work
    3.11 Certified test records
    3.12 Delayed delivery
    3.13 Release for delivery
    3.14 Unchecked parameters
4 Test and measurement procedures
    4.1 General
    4.2 Alternative test methods
    4.3 Precision of measurement
    4.4 Standard conditions for testing
    4.5 Visual inspection
    4.6 Dimensioning and gauging procedures
    4.7 Electrical test procedures
          4.7.1 Frequency and resonance resistance
          4.7.2 Drive level dependency
          4.7.3 Frequency and resonance resistance as
                  a function of temperature
          4.7.4 Unwanted responses
          4.7.5 Shunt capacitance
          4.7.6 Load resonance frequency and resistance
          4.7.7 Frequency pulling range (fL1.L2)
          4.7.8 Motional parameters
          4.7.9 Insulation resistance
    4.8 Mechanical and environmental test procedures
          4.8.1 Robustness of terminations (destructive)
          4.8.2 Sealing tests (non destructive)
          4.8.3 Soldering (solderability and resistance to
                  soldering heat)
          4.8.4 Rapid change of temperature, two-fluid bath
                  method (non destructive)
          4.8.5 Rapid change of temperature with prescribed
                  time of transition (non destructive)
          4.8.6 Bump (destructive)
          4.8.7 Vibration (destructive)
          4.8.8 Shock (destructive)
          4.8.9 Free fall (destructive)
          4.8.10 Acceleration, steady state (non destructive)
          4.8.11 Dry heat (non destructive)
          4.8.12 Damp heat, cyclic (destructive)
          4.8.13 Cold (non destructive)
          4.8.14 Climatic sequence (destructive)
          4.8.15 Dampheat, steady state (destructive)
    4.9 Endurance test procedure
          4.9.1 Ageing (non destructive)
          4.9.2 Extended ageing (non destructive)

Specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures according to clause 11 of IECQ 001002.