IEC 60747-14-2:2000
Current
The latest, up-to-date edition.
Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
09-11-2000
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FOREWORD
INTRODUCTION
1 General
1.1 Scope
1.2 Normative references
1.3 Definitions
1.4 Symbols
2 Essential ratings and characteristics
2.1 General
2.2 Ratings (limiting values)
2.3 Characteristics
3 Measuring methods
3.1 General
3.2 Output Hall voltage (VH)
3.3 Offset voltage (Vo)
3.4 Input resistance (Rin)
3.5 Output resistance (Rout)
3.6 Temperature coefficient of output Hall voltage
(aVH)
3.7 Temperature coefficient of input resistance
(aRin)
Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.
| Committee |
TC 47/SC 47E
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| BS IEC 60747-14.2 : 2000 | Identical |
| NEN IEC 60747-14-2 : 2001 | Identical |
| BS IEC 60747-14-2:2000 | Identical |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
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