IEC 60747-2:2025
Current
The latest, up-to-date edition.
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
Hardcopy , PDF
English
29-09-2025
IEC 60747-2:2025 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices:
- generic rectifier diodes;
- avalanche rectifier diodes;
- fast-switching rectifier diodes;
- Schottky barrier diodes.
If no ambiguity is likely to result, any of the above will be referred to as diodes.
This edition includes the following significant technical changes with respect to the previous edition:
a) the terms and definitions for partial thermal resistance junction-to-case have been added;
b) Clauses 3, 4, 5, 6 and 7 have been amended with some deletions of information no longer in use and with some necessary additions.
| Committee |
TC 47/SC 47E
|
| DocumentType |
Standard
|
| Pages |
50
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
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