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  • IEC 60747-2:2016

    Current The latest, up-to-date edition.

    Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  13-04-2016

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 60747-2:2016 provides standards for the following categories or sub-categories of rectifier diodes, including:
    - line rectifier diodes;
    - avalanche rectifier diodes;
    - fast-switching rectifier diodes;
    - Schottky barrier diodes.
    This edition includes the following significant technical changes with respect to the previous edition:
    a) Schottky barrier diodes and its properties are added;
    b) Clauses 3, 4, 5 and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions;
    c) Clause 6 was moved and added to Clause 7 of this third edition;
    d) some parts of Clause 7 were moved and added to Clause 7 of this third edition;
    e) Annex A was deleted.

    This publication is to be read in conjunction with IEC 60747-1:2006.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes IEC 60147-2A, IEC 60147-0A, IEC 60147-2H, IEC 60147-0E, IEC 60147-1B, IEC 60147-2J, IEC 60147-2E and IEC 60147-1G (07/2004) To be used in conjunction with IEC 60747-1. Stability date: 2018. Supersedes IEC 60747-2-2. (04/2016)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62747:2014 Terminology for voltage-sourced converters (VSC) for high-voltage direct current (HVDC) systems
    BS EN 153000:1998 Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
    07/30161967 DC : 0 BS EN 60747-8 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 8: FIELD-EFFECT TRANSISTORS
    I.S. EN 60749-34:2010 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
    BS EN 60749-34:2010 Semiconductor devices. Mechanical and climatic test methods Power cycling
    BS IEC 60747-8-4:2004 Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
    IEC 60747-8-4:2004 Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications
    CEI EN 60747-15 : 2012 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
    I.S. EN 62751-1:2014 POWER LOSSES IN VOLTAGE SOURCED CONVERTER (VSC) VALVES FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS - PART 1: GENERAL REQUIREMENTS
    IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
    EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
    EN 62747:2014/AC:2015 TERMINOLOGY FOR VOLTAGE-SOURCED CONVERTERS (VSC) FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS (IEC 62747:2014)
    EN 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    EN 61643-321:2002 Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD)
    BS EN 150009:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
    BS EN 150008:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
    I.S. EN 62747:2014-2015-10 TERMINOLOGY FOR VOLTAGE-SOURCED CONVERTERS (VSC) FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS
    IEEE C62.42.3-2017 IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junction
    CEI EN 61643-341 : 2002 COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS)
    I.S. EN 60747-15:2012 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES (IEC 60747-15:2010 (EQV))
    BS IEC 60747-9:2007 Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)
    CEI EN 61643-321 : 2003 COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 321: SPECIFICATIONS FOR AVALANCHE BREAKDOWN DIODE (ABD)
    IEC 60747-9:2007 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
    I.S. EN 153000:1998 DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
    BS CECC50008(1992) : 1992 AMD 7698 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BLANK DETAIL SPECIFICATION: AMBIENT RATED RECTIFIER DIODES
    BS CECC50009(1992) : 1992 AMD 7699 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE RATED RECTIFIER DIODES
    09/30209939 DC : 0 BS EN 60749-34 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
    01/206102 DC : DRAFT JUL 2001 IEC 60747-8-12 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 8-12: 8-12: METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS POWER SWITCHING APPLICATIONS
    07/30162213 DC : 0 BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
    12/30251416 DC : 0 BS EN 62747 - TERMINOLOGY FOR VOLTAGE-SOURCED CONVERTERS (VSC) FOR HVDC SYSTEMS
    BS EN 61643-321:2002 Low voltage surge protective devices Specifications for avalanche breakdown diode (ABD)
    CEI EN 60749-34 : 2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
    BS EN 62751-1:2014 Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems General requirements
    BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
    BS EN 60747-15:2012 Semiconductor devices. Discrete devices Isolated power semiconductor devices
    I.S. EN 62751-2:2014 POWER LOSSES IN VOLTAGE SOURCED CONVERTER (VSC) VALVES FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS - PART 2: MODULAR MULTILEVEL CONVERTERS
    17/30343732 DC : 0 BS EN 60747-9 - SEMICONDUCTOR DEVICES - PART 9: DISCRETE DEVICES - INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS)
    PD IEC/TR 60601-4-3:2015 Medical electrical equipment Guidance and interpretation. Considerations of unaddressed safety aspects in the third edition of IEC 60601-1 and proposals for new requirements
    IEC 60747-8:2010 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
    BS EN 62751-2:2014 Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems Modular multilevel converters
    EN 61643-341:2001 Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)
    BS EN 61643-341:2001 Low voltage surge protective devices Specification for thyristor surge suppressors (TSS)
    BS IEC 60747-8:2000 Discrete semiconductor devices and integrated circuits Field-effect transistors - Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors.
    12/30253588 DC : 0 BS EN 62751-2 - DETERMINATION OF POWER LOSSES IN VOLTAGE SOURCED CONVERTER (VSC) VALVES FOR HVDC SYSTEMS - PART 2: MODULAR MULTILEVEL CONVERTERS
    04/30113287 DC : DRAFT MAY 2004 IEC 60747-9 ED.2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 9: INSULATED GATE BIPOLAR TRANSISTORS (IGBTS)
    04/30114936 DC : DRAFT JUN 2004 EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES
    EN 62751-1:2014 Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 1: General requirements
    EN 62751-2:2014 Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters
    IEC 61643-321:2001 Components for low-voltage surge protective devices - Part 321: Specifications for avalanche breakdown diode (ABD)
    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
    UNE-EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
    IEC 62751-2:2014 Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters
    05/30135225 DC : DRAFT JUN 2005 IEC 60749-9 ED 2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 9: INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS)
    12/30252799 DC : 0 BS EN 62751-1-1 - DETERMINATION OF POWER LOSSES IN VOLTAGE SOURCED CONVERTERS (VSC) FOR HV DC SYSTEMS - PART 1: GENERAL REQUIREMENTS
    BS QC 750000(1986) : 1986 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION
    IEC 62751-1:2014+AMD1:2018 CSV Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 1: General requirements
    IEC 61643-341:2001 Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)
    IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    IEC 60749-23:2004+AMD1:2011 CSV Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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