IEC 60747-8-1:1987
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Semiconductor devices - Discrete devices - Part 8: Field-effecttransistors - Section One: Blank detail specification forsingle-gate field-effect transistors up to 5 W and 1 GHz
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English - French, Russian
30-12-1987
FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
Annex A (normative) Field-effect transistors
Covers the specific requirements for quality assessment of single gate field-effect transistors (up to 5W and 1 GHz). (Also numbered QC 750112 in the IECQ system).
Committee |
TC 47/SC 47E
|
DevelopmentNote |
Also numbered as BS QC750112(1988) (08/2005)
|
DocumentType |
Standard
|
Pages |
33
|
PublisherName |
International Electrotechnical Committee
|
Status |
Withdrawn
|
Standards | Relationship |
UTEC 96 090 : 1989 | Identical |
SAC GB/T 15450 : 1995 | Identical |
DIN IEC 60747-8-1:1991-07 | Identical |
IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
IEC 60747-4-1:2000 | Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification |
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