• IEC 61747-1:1998+AMD1:2003 CSV

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Liquid crystal and solid-state display devices - Part 1: Generic specification

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  12-08-2014

    Language(s):  English - French

    Published date:  15-05-2003

    Publisher:  International Electrotechnical Committee

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terminology
      3.1 Physical concepts
      3.2 General terms
      3.3 Terms related to ratings and characteristics
    4 Technical aspects
      4.1 Order of precedence
      4.2 Terminology, units and symbols
      4.3 Preferred values of temperature, humidity and pressure
      4.4 Marking
           4.4.1 Device identification
           4.4.2 Device traceability
           4.4.3 Packing
      4.5 Categories of assessed quality
      4.6 Screening
      4.7 Handling
    5 Quality assessment procedures
      5.1 Eligibility for qualification approval
           5.1.1 Primary stage of manufacture
      5.2 Commercially confidential information
      5.3 Formation of inspection lots
      5.4 Structurally similar devices
      5.5 Granting of qualification approval
      5.6 Quality conformance inspection
           5.6.1 Division into groups and subgroups
           5.6.2 Inspection requirements
           5.6.3 Supplementary procedure for reduced inspection
           5.6.4 Sampling requirements for small lots
           5.6.5 Certified records of released lots (CRRL)
           5.6.6 Delivery of devices subjected to destructive or
                 non-destructive tests
           5.6.7 Delayed deliveries
           5.6.8 Supplementary procedure for deliveries
      5.7 Statistical sampling procedures
           5.7.1 AQL sampling plans
           5.7.2 LTPD sampling plans
      5.8 Endurance tests
      5.9 Endurance tests where the failure rate is specified
           5.9.1 General
           5.9.2 Selection of samples
           5.9.3 Failure
           5.9.4 Endurance test time and sample size
           5.9.5 Procedure to be used if the number of failures
                 exceeds the acceptance number
      5.10 Accelerated test procedures
      5.11 Capability approval
    6 Test and measurement procedures
      6.1 Standard atmospheric conditions for electrical and
           optical measurements
      6.2 Physical examination
           6.2.1 Visual examination
           6.2.2 Dimensions
           6.2.3 Permanence of marking
      6.3 Electrical and optical measurements
           6.3.1 General conditions and precautions
      6.4 Environmental tests
    Annex A (informative) Cross references index
    Annex B (informative) Examples of outline drawings of
                          liquid-crystal display cells
    Annex C (normative) Orientation of LCD modules
    Annex D (normative) Lot tolerance percentage defective
                          (LTPD) sampling plans
    Bibliography

    Abstract - (Show below) - (Hide below)

    Defines general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.This consolidated version consists of the first edition (1998) and its amendment 1 (2003). Therefore, no need to order amendment inaddition to this publication.

    General Product Information - (Show below) - (Hide below)

    Committee TC 110
    Development Note Supersedes IEC 60747-5 (07/2004) Also numbered as BS EN 61747-1. (01/2006) Stability Date: 2016. (11/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 61747-30-1:2012 (published 2012-09) Liquid crystal display devices Measuring methods for liquid crystal display modules. Transmissive type
    I.S. EN 61747-5-3:2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    CEI EN 62595-2 : 2013 LCD BACKLIGHT UNIT - PART 2: ELECTRO-OPTICAL MEASUREMENT METHODS OF LED BACKLIGHT UNIT
    09/30192488 DC : 0 BS EN 62595 ED.1 - MEASUREMENT METHODS OF LED BACKLIGHT UNIT FOR LIQUID CRYSTAL DISPLAYS
    14/30277719 DC : 0 BS EN 61747-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 2: LIQUID CRYSTAL DISPLAY MODULES - SECTIONAL SPECIFICATION
    14/30273272 DC : 0 BS ISO 18383 - PHOTOGRAPHY - DIGITAL CAMERAS - SPECIFICATION GUIDELINE
    BS EN 61747-5-3 : 2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    12/30244653 DC : 0 BS EN 62679-1 - ELECTRONIC PAPER DISPLAY - PART 1:TERMINOLOGY AND GENERIC SPECIFICATION
    09/30199792 DC : 0 BS EN 61747-6-1 ED.2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 6-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE
    02/206627 DC : DRAFT JUN 2002 IEC 61747-4-2. ED.1.0 - LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 4-2: MATRIX COLOUR LCD MODULES - ESSENTIAL RATING AND CHARACTERISTICS
    BS EN 61747-4-1 : 2004 LIQUID CRYSTAL DISPLAY DEVICES - PART 4-1: MATRIX COLOUR LCD MODULES - ESSENTIAL RATINGS AND CHARACTERISTICS
    BS EN 61747-6-2 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-2: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - REFLECTIVE TYPE
    CEI EN 61747-2-1 : 2014 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION
    11/30247384 DC : 0 BS EN 61747-4 - LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS
    BS EN 61747-2-1 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION
    BS EN 62595-2 : 2013 LCD BACKLIGHT UNIT - PART 2: ELECTRO-OPTICAL MEASUREMENT METHODS OF LED BACKLIGHT UNIT
    BS EN 61747-5-2:2011 Liquid crystal display devices Environmental, endurance and mechanical test methods. Visual inspection of active matrix colour liquid crystal display modules
    BS EN 61747-10-1 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL
    BS EN 61747-3 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    BS ISO 18383 : 2015 PHOTOGRAPHY - DIGITAL CAMERAS - SPECIFICATION GUIDELINE
    07/30170138 DC : 0 BS EN 61747-6-3 - LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    10/30234593 DC : 0 BS EN 61747-5-4 ED.1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 5-4: ENVIRONMENTAL, ENDURANCE AND MECHANICALTEST METHODS - MECHANICAL TESTING GUIDELINES FOR DISPLAY COVER GLASS FOR DISPLAY COVER GLASS FOR MOBILE DEVICES
    CEI EN 61747-3 : 2007 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DISPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    BIS IS 15934-2 : 2012 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 2: LIQUID CRYSTAL DISPLAY MODULES - SECTIONAL SPECIFICATION
    BS IEC 62679-1-1:2014 (published 2014-07) Electronic paper displays Terminology
    CEI EN 61747-4-1 : 2005 LIQUID CRYSTAL DISPLAY DEVICES - PART 4-1: MATRIX COLOUR LCD MODULES - ESSENTIAL RATINGS AND CHARACTERISTICS
    CEI EN 61747-10-1 : 2014 LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL
    18/30373509 DC : DRAFT APR 2018 BS EN 61747-30-3 - LIQUID CRYSTAL DISPLAY DEVICES - PART 30-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    BIS IS 15934-4-1 : 2014 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: MATRIX COLOUR LCD MODULES - SECTION 1: ESSENTIAL RATINGS AND CHARACTERISTICS
    NF EN 61747-5-3 : 2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    I.S. EN 61747-30-1:2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 30-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE (IEC 61747-30-1:2012 (EQV))
    BIS IS 15934-4 : 2014 LIQUID CRYSTAL AND SOLID STATE DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS
    BS EN 61747-4 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS
    BS EN 61747-2:1999 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 2: LIQUID CRYSTAL DISPLAY MODULES - SECTIONAL SPECIFICATION
    07/30168025 DC : 0 BS EN 61747-5-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    13/30277711 DC : 0 BS EN 61747-2-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 2-2: MATRIX COLOUR LCD MODULES - BLANK DETAIL SPECIFICATION
    14/30277702 DC : 0 BS EN 61747-3 - LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DISPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    07/30161587 DC : 0 BS EN 61747-6-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 6-2: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - REFLECTIVE TYPE
    BS PD IEC TR 62728 : 2011 DISPLAY TECHNOLOGIES - LCD, PDP, AND OLED - OVERVIEW AND EXPLANATION OF DIFFERENCES IN TERMINOLOGY
    11/30251376 DC : 0 BS EN 61747-40-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 40-1: MECHANICAL TESTING GUIDELINES FOR DISPLAY COVER GLASS FOR MOBILE DEVICES
    CEI EN 61747-5-2 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    14/30300376 DC : 0 BS EN 61747-3-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION
    BS EN 61747-3-1 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION
    BS EN 61747-6-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    IEC TR 62728:2011 Display technologies - LCD, PDP and OLED - Overview and explanation of differences in terminology
    CEI EN 61747-30-1 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 30-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE
    I.S. EN 62595-2:2013 LCD BACKLIGHT UNIT - PART 2: ELECTRO-OPTICAL MEASUREMENT METHODS OF LED BACKLIGHT UNIT (IEC 62595-2:2012 (EQV))
    CEI EN 61747-6-2 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-2: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - REFLECTIVE TYPE
    I.S. EN 61747-4-1:2005 LIQUID CRYSTAL DISPLAY DEVICES - PART 4-1: MATRIX COLOUR LCD MODULES - ESSENTIAL RATINGS AND CHARACTERISTICS
    CEI EN 61747-4 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS
    I.S. EN 61747-6-3:2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    IEC 61747-5-3:2009 Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
    I.S. EN 61747-5-2:2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    I.S. EN 61747-10-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL (IEC 61747-10-1:2013 (EQV))
    BS IEC 61747-40-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 40-1: MECHANICAL TESTING OF DISPLAY COVER GLASS FOR MOBILE DEVICES - GUIDELINES
    ISO 18383:2015 Photography Digital cameras Specification guideline
    CEI EN 61747-5-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    CEI EN 61747-6-3 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    BIS IS 16178 : 2014 DISPLAY TECHNOLOGIES LCD, PDP AND OLED - OVERVIEW AND EXPLANATION OF DIFFERENCES IN TERMINOLOGY
    BS IEC 61747-3 : 1998 AMD 10786 LIQUID CRYSTAL AND SOLID STATE DISPLAY DEVICES - SECTIONAL SPECIFICATION FOR LIQUID CRYSTAL DISPLAY (LCD) CELLS
    I.S. EN 61747-2-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION (IEC 61747-2-1:2013 (EQV))
    I.S. EN 61747-4:2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS (IEC 61747-4:2012 (EQV))
    I.S. EN 61747-3:2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    I.S. EN 61747-6-2:2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-2: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - REFLECTIVE TYPE
    IEC 62679-1-1:2014 Electronic paper displays - Part 1-1: Terminology
    IEC 62595-2-1:2016 Display lighting unit - Part 2-1: Electro-optical measuring methods of LED backlight unit
    IEC 61747-6-3:2011 Liquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules
    IEC 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
    IEC 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
    IEC 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
    IEC 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
    IEC 62595-2:2012 LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit
    IEC 61747-5-2:2011 Liquid crystal display devices - Part 5-2: Environmental, endurance and mechanical test methods - Visual inspection of active matrix colour liquid crystal display modules
    IEC 61747-10-1:2013 Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
    EN 61747-5-2 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    EN 61747-5-3 : 2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    EN 61747-2 : 1999 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - LIQUID CRYSTAL DISPLAY MODULES - SECTIONAL SPECIFICATION
    EN 61747-6-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    EN 61747-4 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS (IEC 61747-4:2012)
    EN 61747-10-1 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL (IEC 61747-10-1:2013)
    EN 61747-6-2 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-2: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - REFLECTIVE TYPE
    EN 62595-2 : 2013 LCD BACKLIGHT UNIT - PART 2: ELECTRO-OPTICAL MEASUREMENT METHODS OF LED BACKLIGHT UNIT (IEC 62595-2:2012)
    EN 61747-30-1 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 30-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE (IEC 61747-30-1:2012)
    EN 61747-4-1 : 2004 LIQUID CRYSTAL DISPLAY DEVICES - PART 4-1: MATRIX COLOUR LCD MODULES - ESSENTIAL RATINGS AND CHARACTERISTICS
    EN 61747-3-1 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION
    EN 61747-3 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-2-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION (IEC 61747-2-1:2013)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60050-351:2013 International Electrotechnical Vocabulary (IEV) - Part 351: Control technology
    IEC 60747-4:2007+AMD1:2017 CSV Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
    IEC 60068-4:1987 Environmental testing. Part 4: Information for specification writers - Test summaries
    IEC 60050-31:1959 International Electrotechnical Vocabulary (IEV) - Part 31: Signalling and security apparatus for railways
    IEC 60050-541:1990 International Electrotechnical Vocabulary (IEV) - Part 541: Printed circuits
    IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
    IEC 60050-394:2007 International Electrotechnical Vocabulary (IEV) - Part 394: Nuclear instrumentation - Instruments, systems, equipment and detectors
    IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
    IEC 60068-2-5:2010 Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
    IEC 60068-2-70:1995 Environmental testing - Part 2-70: Tests - Test Xb: Abrasion of markings and letterings caused by rubbing of fingers and hands
    IEC 60068-2-18:2017 Environmental testing - Part 2-18: Tests - Test R and guidance: Water
    IEC 60050-702:1992 International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
    IEC 60747-7-2:1989 Semiconductor devices - Discrete devices - Part 7: Bipolartransistors - Section Two: Blank detail specification forcase-rated bipolar transistors for low-frequency amplification
    IEC 60068-2-43:2003 Environmental testing - Part 2-43: Tests - Test Kd: Hydrogen sulphide test for contacts and connections
    IEC 60068-2-68:1994 Environmental testing - Part 2-68: Tests - Test L: Dust and sand
    IEC 60050-731:1991 International Electrotechnical Vocabulary (IEV) - Part 731: Optical fibre communication
    IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
    IEC 60617-9:1996 Graphical symbols for diagrams - Part 9: Telecommunications - Switching and peripheral equipment
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
    IEC 60050-806:1996 International Electrotechnical Vocabulary (IEV) - Part 806: Recording and reproduction of audio and video
    IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
    IEC 60747-3:2013 Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
    IEC 60747-12-6:1997 Semiconductor devices - Part 12-6: Optoelectronic devices - Blank detail specification for avalanche photodiodes with/without pigtail, for fibre optic systems or subsystems
    IEC 60191-2R:1995 Sixteenth supplement
    IEC 60747-12:1991 Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices
    IEC 60748-2-1:1991 Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
    IEC 60050-716-1:1995 International Electrotechnical Vocabulary (IEV) - Part 716-1: Integrated services digital network (ISDN) - General aspects
    IEC 60050-691:1973 International Electrotechnical Vocabulary (IEV) - Part 691: Tariffs for electricity
    IEC 60191-2G:1978 Seventh supplement
    IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60050-811:1991 International Electrotechnical Vocabulary (IEV) - Part 811: Electric traction
    IEC 60050-481:1996 International Electrotechnical Vocabulary (IEV) - Part 481: Primary cells and batteries
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60191-3C:1987 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Third supplement
    IEC 60050-531:1974 International Electrotechnical Vocabulary (IEV) - Part 531: Electronic tubes
    IEC 60068-3-1A:1978 Environmental testing - Part 3: Background information - First supplement
    IEC 60748-11-1:1992 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
    IEC 60068-2-60:2015 RLV Environmental testing - Part 2-60: Tests - Test Ke: Flowing mixed gas corrosion test
    IEC 60068-5-2:1990 Environmental testing - Part 5-2: Guide to drafting of test methods - Terms and definitions
    IEC 60747-7-1:1989 Semiconductor devices - Discrete devices - Part 7: Bipolartransistors - Section One: Blank detail specification forambient-rated bipolar transistors for low and high-frequencyamplification
    IEC 60747-8-1:1987 Semiconductor devices - Discrete devices - Part 8: Field-effecttransistors - Section One: Blank detail specification forsingle-gate field-effect transistors up to 5 W and 1 GHz
    IEC 60050-605:1983 International Electrotechnical Vocabulary (IEV) - Part 605: Generation, transmission and distribution of electricity - Substations
    IEC 60050-601:1985 International Electrotechnical Vocabulary (IEV) - Part 601: Generation, transmission and distribution of electricity - General
    IEC 60050-721:1991 International Electrotechnical Vocabulary (IEV) - Part 721: Telegraphy, facsimile and data communication
    IEC 60617-10:1996 Graphical symbols for diagrams - Part 10: Telecommunications - Transmission
    IEC 60068-3-1:2011 Environmental testing - Part 3-1: Supporting documentation and guidance - Cold and dry heat tests
    IEC 60050-60:1970 International Electrotechnical Vocabulary (IEV) - Part 60: Radiocommunications.
    IEC 60050-471:2007 International Electrotechnical Vocabulary (IEV) - Part 471: Insulators
    IEC 60191-2D:1971 Fourth supplement
    IEC 60068-2-49:1983 Basic environmental testing procedures - Part 2-49: Tests - Guidance to test Kc: Sulphur dioxide test for contacts and connections
    IEC 60050-411:1996 International Electrotechnical Vocabulary (IEV) - Part 411: Rotating machinery
    IEC 60050-151:2001 International Electrotechnical Vocabulary (IEV) - Part 151: Electrical and magnetic devices
    ISO 1101:2017 Geometrical product specifications (GPS) Geometrical tolerancing Tolerances of form, orientation, location and run-out
    IEC 60617-3:1996 Graphical symbols for diagrams - Part 3: Conductors and connecting devices
    IEC 60748-2-7:1992 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
    IEC 60050-441:1984 International Electrotechnical Vocabulary (IEV) - Part 441: Switchgear, controlgear and fuses
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    IEC 60068-2-57:2013 Environmental testing - Part 2-57: Tests - Test Ff: Vibration - Time-history and sine-beat method
    IEC 60068-2-50:1983 Environmental testing. Part 2: Tests. Tests Z/AFc: Combined cold/vibration (sinusoidal) tests for both heat-dissipating and non-heat-dissipating specimens
    IEC 60050-212:2010 International Electrotechnical Vocabulary (IEV) - Part 212: Electrical insulating solids, liquids and gases
    IEC 60191-2L:1982 Eleventh supplement
    IEC 60617-6:1996 Graphical symbols for diagrams - Part 6: Production and conversion of electrical energy
    IEC 60050-845:1987 International Electrotechnical Vocabulary (IEV) - Part 845: Lighting
    IEC 60068-5-1:1991 Environmental testing - Part 5-1: Guide to drafting of test methods - General principles
    IEC 60050-722:1992 International Electrotechnical Vocabulary (IEV) - Part 722: Telephony
    IEC 60068-3-2:1976 Basic environmental testing procedures - Part 3-2: Background information - Combined temperature/low air pressure tests
    IEC 60050-221:1990 International Electrotechnical Vocabulary (IEV) - Part 221: Magnetic materials and components
    IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
    IEC 60050-486:1991 International Electrotechnical Vocabulary (IEV) - Part 486: Secondary cells and batteries
    IEC 60068-2-39:2015 Environmental testing - Part 2-39: Tests - Tests and guidance: Combined temperature or temperature and humidity with low air pressure tests
    IEC 60050-704:1993 International Electrotechnical Vocabulary (IEV) - Part 704: Transmission
    IEC 60191-1B:1970 Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices - Second supplement
    IEC 60747-12-5:1997 Semiconductor devices - Part 12-5: Optoelectronic devices - Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems
    IEC 60747-2-1:1989 Semiconductor devices - Discrete devices - Part 2: Rectifier diodes- Section One: Blank detail specification for rectifier diodes(including avalanche rectifier diodes), ambient and case-rated, upto 100 A
    IEC 60050-891:1998 International Electrotechnical Vocabulary (IEV) - Part 891: Electrobiology
    IEC 60068-2-66:1994 Environmental testing - Part 2: Test methods - Test Cx: Damp heat, steady state (unsaturated pressurized vapour)
    IEC 60747-2-2:1993 Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section 2: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60191-2F:1976 Sixth supplement
    IEC 60748-2-6:1991 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section Six: Blank detail specification for microprocessor integrated circuits
    IEC 60747-7-3:1991 Semiconductor devices - Discrete devices - Part 7: Bipolartransistors - Section three: Blank detail specification for bipolartransistors for switching applications
    IEC 60068-2-31:2008 Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
    IEC 60191-2K:1981 Tenth supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
    IEC 60748-4-2:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue-to-digital converters (ADC)
    IEC 60050-551:1998 International Electrotechnical Vocabulary (IEV) - Part 551: Power electronics
    IEC 60191-1A:1969 Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices - First supplement
    IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
    IEC 60068-2-53:2010 Environmental testing - Part 2-53: Tests and guidance - Combined climatic (temperature/humidity) and dynamic (vibration/shock) tests
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    IEC 60191-1C:1974 Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices - Third supplement
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60068-2-67:1995 Environmental testing - Part 2-67: Tests - Test Cy: Damp heat, steady state, accelerated test primarily intended for components
    IEC 60068-3-3:1991 Environmental testing - Part 3-3: Guidance - Seismic test methods for equipments
    IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
    IEC 60050-801:1994 International Electrotechnical Vocabulary (IEV) - Part 801: Acoustics and electroacoustics
    IEC 60050-426:2008 International Electrotechnical Vocabulary (IEV) - Part 426: Equipment for explosive atmospheres
    IEC 60747-3-1:1986 Semiconductor devices - Discrete devices - Part 3: Signal(including switching) and regulator diodes - Section One: Blankdetail specification for signal diodes, switching diodes andcontrolled-avalanche diodes
    IEC 60191-2H:1978 Eigth supplement
    IEC 60191-3B:1978 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Second supplement
    IEC 60068-2-38:2009 Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
    IEC 60617-5:1996 Graphical symbols for diagrams - Part 5: Semiconductors and electron tubes
    IEC 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
    IEC 60747-12-3:1998 Semiconductor devices - Part 12-3: Optoelectronic devices - Blank detail specification for light-emitting diodes- Display application
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60191-2A:1967 First supplement to Publication 191-2 (1966)Mechanical standardization of semiconductor devices - Part 2: DimensionsPart 2: Dimensions
    IEC 60191-2B:1969 Second supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60050-715:1996 International Electrotechnical Vocabulary (IEV) - Part 715: Telecommunication networks, teletraffic and operation
    IEC 60747-3-2:1986 Semiconductor devices - Discrete devices - Part 3: Signal(including switching) and regulator diodes - Section Two: Blankdetail specification for voltage-regulator diodes andvoltage-reference diodes,excluding temperature-compensatedprecision reference diodes
    IEC 60068-2-47:2005 Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests
    IEC 60748-11:1990 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC 60050-55:1970 International Electrotechnical Vocabulary (IEV) - Part 55: Telegraphy and telephony
    IEC 60747-8:2010 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
    IEC 60050-131A:1982 International Electrotechnical Vocabulary (IEV) - Part 131A: Electric and magnetic circuits - Polyphase circuits and components
    ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
    IEC 60050-421:1990 International Electrotechnical Vocabulary (IEV) - Part 421: Power transformers and reactors
    IEC 60050-701:1988 International Electrotechnical Vocabulary (IEV) - Part 701: Telecommunications, channels and networks
    IEC 60068-2-54:2006 Environmental testing - Part 2-54: Tests - Test Ta: Solderability testing of electronic components by the wetting balance method
    IEC 60050-603:1986 International Electrotechnical Vocabulary (IEV) - Part 603: Generation, transmission and distribution of electricity - Power systems planning and management
    IEC 60027-3:2002 Letter symbols to be used in electrical technology - Part 3: Logarithmic and related quantities, and their units
    IEC 60050-714:1992 International Electrotechnical Vocabulary (IEV) - Part 714: Switching and signalling in telecommunications
    IEC 60050-466:1990 International Electrotechnical Vocabulary (IEV) - Part 466: Overhead lines
    IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
    IEC 60050-446:1983 International Electrotechnical Vocabulary (IEV) - Part 446: Electrical relays
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60617-1:1985 Graphical symbols for diagrams. Part 1: General information, general index. Cross-reference tables
    IEC 60191-2J:1980 Ninth supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
    IEC 60191-2S:1995 Seventeenth supplement
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60747-8-3:1995 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications
    IEC 60068-2-9:1975 Environmental testing - Part 2: Tests. Guidance for solar radiation testing
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60050-821:1998 International Electrotechnical Vocabulary (IEV) - Part 821: Signalling and security apparatus for railways
    IEC 60748-2-5:1992 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
    IEC 60617-13:1993 Graphical symbols for diagrams - Part 13: Analogue elements
    IEC 60068-2-61:1991 Environmental testing - Part 2-61: Test methods - Test Z/ABDM:Climatic sequence
    IEC 60191-3D:1988 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Fourth supplement
    IEC 60050-726:1982 International Electrotechnical Vocabulary (IEV) - Part 726: Transmission lines and waveguides
    IEC 60191-2C:1970 Third supplement
    IEC 60050-841:2004 International Electrotechnical Vocabulary (IEV) - Part 841: Industrial electroheat
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60617-7:1996 Graphical symbols for diagrams - Part 7: Switchgear, controlgear and protective devices
    IEC 60617-8:1996 Graphical symbols for diagrams - Part 8: Measuring instruments, lamps and signalling devices
    IEC 60068-2-42:2003 Environmental testing - Part 2-42: Tests - Test Kc: Sulphur dioxide test for contacts and connections
    IEC 60747-12-4:1997 Semiconductor devices - Part 12-4: Optoelectronic devices - Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems
    IEC 60050-121:1998 International Electrotechnical Vocabulary (IEV) - Part 121: Electromagnetism
    IEC 60050-321:1986 International Electrotechnical Vocabulary (IEV) - Part 321: Instrument transformers
    IEC 60050-461:2008 International Electrotechnical Vocabulary (IEV) - Part 461: Electric cables
    IEC 60191-2Q:1990 fifteenth complement
    IEC 60748-4-1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Blank detail specification for linear digital-to-analogue converters (DAC)
    IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60191-3A:1976 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - First supplement
    IEC 60748-2-9:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories
    IEC 60050-826:2004 International Electrotechnical Vocabulary (IEV) - Part 826: Electrical installations
    IEC 60748-22:1997 Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
    IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
    IEC 60068-2-75:2014 Environmental testing - Part 2-75: Tests - Test Eh: Hammer tests
    IEC 60748-3-1:1991 Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiers
    IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 60748-2-10:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
    IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
    IEC 60068-2-28:1990 Environmental testing - Part 2: Tests. Guidance for damp heat tests
    IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
    IEC 60068-2-8:1960 Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test H: Storage
    IEC 60617-4:1996 Graphical symbols for diagrams - Part 4: Passive components
    IEC 60191-4:2013 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
    IEC 60191-5:1997 Mechanical standardization of semiconductor devices - Part 5: Recommendations applying to integrated circuit packages using tape automated bonding (TAB)
    IEC 60050-26:1968 International Electrotechnical Vocabulary (IEV) - Part 26: Nuclear power plants for electric energy generation
    IEC 60191-3F:1994 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Sixth supplement
    IEC 60748-20-1:1994 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60050-111:1996 International Electrotechnical Vocabulary (IEV) - Part 111: Physics and chemistry
    IEC 60747-8-2:1993 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section two: Blank detail specification for field-effect transistors for case-rated power amplifier applications
    IEC 60748-2-8:1993 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section Eight: Blank detail specification for integrated circuit static read/write memories
    IEC 60027-4:2006 Letter symbols to be used in electrical technology - Part 4: Rotating electric machines
    IEC 60191-2U:1997 Nineteenth supplement
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    IEC 60068-2-48:1982 Environmental testing - Part 2: Tests. Guidance on the application of the tests of IEC 68 to simulate the effects of storage
    IEC 60068-2-55:2013 Environmental testing - Part 2-55: Tests - Test Ee and guidance - Loose cargo testing including bounce
    IEC 60050-705:1995 International Electrotechnical Vocabulary (IEV) - Part 705: Radio wave propagation
    IEC 60050-602:1983 International Electrotechnical Vocabulary (IEV) - Part 602: Generation, transmission and distribution of electricity - Generation
    IEC 60748-21-1:1997 Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    IEC 60068-2-44:1995 Environmental testing - Part 2-44: Tests - Guidance on test T: Soldering
    IEC 60748-21:1997 Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
    IEC 60191-2N:1987 Thirteenth supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60050-448:1995 International Electrotechnical Vocabulary (IEV) - Part 448: Power system protection
    IEC 60027-2B:1980 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
    IEC 60050-712:1992 International Electrotechnical Vocabulary (IEV) - Part 712: Antennas
    IEC 60050-851:2008 International Electrotechnical Vocabulary (IEV) - Part 851: Electric welding
    IEC 60748-2-4:1992 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section four: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB
    IEC 60747-12-1:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 1: Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fibre optic systems and sub-systems
    IEC 60747-6-3:1993 Semiconductor devices - Discrete devices - Part 6: Thyristors - Section Three: Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A
    IEC 60050-581:2008 International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment
    IEC 60068-2-52:2017 Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
    IEC 60050-723:1997 International Electrotechnical Vocabulary (IEV) - Part 723: Broadcasting: Sound, television, data
    IEC 60068-2-65:2013 Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method
    IEC 60747-11:1985 Semiconductor devices. Discrete devices. Part 11: Sectionalspecification for discrete devices
    IEC 60050-881:1983 International Electrotechnical Vocabulary (IEV) - Part 881: Radiology and radiological physics
    IEC 60068-2-69:2017 Environmental testing - Part 2-69: Tests - Test Te/Tc: Solderability testing of electronic components and printed boards by the wetting balance (force measurement) method
    IEC 60027-2A:1975 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics - First supplement
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    IEC 60050-371:1984 International Electrotechnical Vocabulary (IEV) - Part 371: Telecontrol
    IEC 60191-3E:1990 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Fifth supplement
    IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
    IEC 60191-2P:1988 Fourteenth supplement
    IEC 60617-11:1996 Graphical symbols for diagrams - Part 11: Architectural and topographical installation plans and diagrams
    IEC 60068-2-51:1983 Environmental testing. Part 2: Tests. Tests Z/BFc: Combined dry heat/vibration (sinusoidal) tests for both heat-dissipating and non-heat-dissipating specimens
    IEC 60050-393:2003 International Electrotechnical Vocabulary (IEV) - Part 393: Nuclear instrumentation - Physical phenomena and basic concepts
    IEC 60617-2:1996 Graphical symbols for diagrams - Partie 2: Symbol elements, qualifying symbols and other symbols having general application
    IEC 60191-2M:1983 Twelfth supplement
    IEC 60191-2E:1974 Fifth supplement
    IEC 60747-6-2:1991 Semiconductor devices - Discrete devices - Part 6: Thyristors -Section Two: Blank detail specification for bidirectional triodethyristors (triacs), ambient or case-rated, up to 100 A
    IEC 60617-12:1997 Graphical symbols for diagrams - Part 12: Binary logic elements
    IEC 60747-6-1:1989 Semiconductor devices - Discrete devices - Part 6: Thyristors -Section One: Blank detail specification for reverse blocking triodethyristors, ambient and case-rated, up to 100 A
    IEC 60068-2-46:1982 Basic environmental testing procedures - Part 2-46: Tests - Guidance to test Kd: Hydrogen sulphide test for contacts and connections
    IEC 60050-725:1994 International Electrotechnical Vocabulary (IEV) - Part 725: Space radiocommunications
    IEC 60068-2-59:1990 Environmental testing. Part 2: Tests. Test Fe: Vibration - Sine-beat method
    IEC 60748-22-1:1997 Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
    IEC 60191-2T:1996 Eighteenth supplement
    IEC 60068-2-56:1988 Environmental testing - Part 2: Tests. Test Cb: Damp heat, steady state, primarily for equipment
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective