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  • IEC 60747-8-3:1995

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  13-01-2014

    Language(s):  English - French

    Published date:  20-04-1995

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Mechanical description
    2 Short description
    3 Categories of assessed quality
    4 Limiting values (absolute maximum rating system)
       common to all applications
    5 Electrical characteristics
    6 Marking
    7 Ordering information
    8 Test conditions and inspection requirements
    9 Group D - Qualification approval tests
    10 Additional information (not for inspection purposes)

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    This publication also bears the number QC 750114 which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ).

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    Development Note Also numbered as BS QC750114(1996) (08/2005) Stability Date: 2013. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
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