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  • IEC 60748-11-1:1992

    Current The latest, up-to-date edition.

    Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French, Russian

    Published date:  01-04-1992

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    Clause
    1 Scope and object
    2 Apparatus
    3 Procedure for integrated circuits
      3.0 Introduction
      3.1 Test conditions
      3.2 Specified conditions
    Figures

    Abstract - (Show below) - (Hide below)

    The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes IEC 60186B. (07/2004) Also numbered as BS QC790101(1992) (08/2005) Stability Date: 2021. (11/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
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