IEC 60748-2-1:1991
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
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01-10-1991
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FOREWORD
INTRODUCTION
1 Marking and ordering information
2 Application related description
3 Specification of the function
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified operating
temperature range)
6 Electrical characteristics
7 Programming
8 Mechanical and climatic ratings, characteristics and data
9 Additional information
10 Screening
11 Quality assessment procedures
12 Structural similarity procedures
13 Test conditions and inspection requirements
14 Additional measurement method
| DevelopmentNote |
Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
31
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS QC 790132:1992 | Identical |
| EN 60747-16-4:2004/A2:2017 | SEMICONDUCTOR DEVICES - PART 16-4: MICROWAVE INTEGRATED CIRCUITS - SWITCHES (IEC 60747-16-4:2004/A2:2017) |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
| I.S. EN 60747-16-4:2004 | SEMICONDUCTOR DEVICES - PART 16-4: MICROWAVE INTEGRATED CIRCUITS - SWITCHES |
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