IEC 60748-21-1:1997
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
10-04-1997
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INTRODUCTION
Clause
1. Characteristics and conditions of use
2. Recommended methods of mounting
3. Marking
4. Ordering information
5. Certified records of released lots
6. Additional information
7. Additional or increased severities or requirements
to those specified in the generic and/or sectional
specification
8. Inspection requirements (see tables 2 and 3 or 4
and 5)
9. Supplement - Tables of method B
Tables
1. Where a range of circuits
2. Method A - Groups A and B - Lot-by-Lot
3a. Method A - Group C - Periodic tests
3b. Method A - Group D - Periodic tests
4a. Method B - Group A - Lot-by-Lot
4b. Method B - Group B - Lot-by-Lot
5a. Method B - Group C - Periodic tests
5b. Method B - Group D - Periodic tests
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
Also numbered as BS QC 760101(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
29
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| SAC GB/T 13062 : 2018 | Identical |
| NEN IEC 60748-21-1 : 1998 | Identical |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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