IEC 60748-22:1997
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
10-04-1997
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FOREWORD
1 Scope and object
2 General preferred characteristics, ratings and
severities for environmental tests
2.1 Normative references
2.2 Preferred ratings and characteristics
2.3 Information to be given in a detail specification
3 Capability approval procedures
3.1 Selection of capability qualifying circuits
(CQCs)
3.2 Structural similarity
3.3 Capability approval
3.4 Resubmission of rejected lots (lot-by-lot
inspection)
3.5 Manufacturing stages in a factory of an approved
manufacturer
4 Test and measurement procedures
5 Tables for method B
Annexes
A Structural similarity rules for capability approval
B Minimum contents of a manufacturer's capability manual
for thick film circuits
C Minimum contents of a manufacturer's capability manual
for thin film circuits
Tables
1 Test schedule for capability approval for method A
2 Assessment levels and acceptance criteria for capability
manual for thick film circuits
3 Assessment levels and acceptance criteria for quality
conformance inspection for method A
4 Screening
5 Test schedule for capability approval for method B
6 Assessment levels and acceptance criteria for
capability approval for method B
7 Assessment levels and acceptance criteria for quality
conformance inspection for method B
Applies to film and hybrid film integrated circuits (F and HICs),manufactured as catalogue or as custom-built circuits whosequality is assessed on the basis of the capability approvalprocedure. Presents preferred values for ratings andcharacteristics, selects from the generic specificationthe appropriate tests and measuring methods and gives generalperformance requirements to be used in detailspecifications for film and hybrid film integrated circuits.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
Also numbered as BS QC760200(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
121
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NEN IEC 60748-22 : 1998 | Identical |
| BS QC 760201:1992 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: capability approval |
| BS QC 760201:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60748-21:1991 | Semiconductor devices. Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure. |
| IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
| IEC 60748-20-1:1994 | Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination |
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