• IEC 60748-22:1997

    Current The latest, up-to-date edition.

    Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  10-04-1997

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope and object
    2 General preferred characteristics, ratings and
        severities for environmental tests
        2.1 Normative references
        2.2 Preferred ratings and characteristics
        2.3 Information to be given in a detail specification
    3 Capability approval procedures
        3.1 Selection of capability qualifying circuits
              (CQCs)
        3.2 Structural similarity
        3.3 Capability approval
        3.4 Resubmission of rejected lots (lot-by-lot
              inspection)
        3.5 Manufacturing stages in a factory of an approved
              manufacturer
    4 Test and measurement procedures
    5 Tables for method B
    Annexes
    A Structural similarity rules for capability approval
    B Minimum contents of a manufacturer's capability manual
        for thick film circuits
    C Minimum contents of a manufacturer's capability manual
        for thin film circuits
    Tables
    1 Test schedule for capability approval for method A
    2 Assessment levels and acceptance criteria for capability
        manual for thick film circuits
    3 Assessment levels and acceptance criteria for quality
        conformance inspection for method A
    4 Screening
    5 Test schedule for capability approval for method B
    6 Assessment levels and acceptance criteria for
        capability approval for method B
    7 Assessment levels and acceptance criteria for quality
        conformance inspection for method B

    Abstract - (Show below) - (Hide below)

    Applies to film and hybrid film integrated circuits (F and HICs),manufactured as catalogue or as custom-built circuits whosequality is assessed on the basis of the capability approvalprocedure. Presents preferred values for ratings andcharacteristics, selects from the generic specificationthe appropriate tests and measuring methods and gives generalperformance requirements to be used in detailspecifications for film and hybrid film integrated circuits.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47A
    Development Note Also numbered as BS QC760200(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC760201(1997) : 1997 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR FILM INTEGRATED CIRCUITS AND HYBRID FILM INTEGRATED CIRCUITS ON THE BASIS OF THE CAPABILITY APPROVAL PROCEDURES
    BS QC760201(1992) : 1992 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. SEMICONDUCTOR DEVICES. INTEGRATED CIRCUITS. BLANK DETAIL SPECIFICATION. FILM AND HYBRID INTEGRATED CIRCUITS CAPABILITY APPROVAL
    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60748-21:1991 Semiconductor devices. Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure.
    IEC TR 60440:1973 Method of measurement of non-linearity in resistors
    IEC 60063:2015 Preferred number series for resistors and capacitors
    IEC 60748-20-1:1994 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
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