IEC 60748-22:1997

FOREWORD
1 Scope and object
2 General preferred characteristics, ratings and
    severities for environmental tests
    2.1 Normative references
    2.2 Preferred ratings and characteristics
    2.3 Information to be given in a detail specification
3 Capability approval procedures
    3.1 Selection of capability qualifying circuits
          (CQCs)
    3.2 Structural similarity
    3.3 Capability approval
    3.4 Resubmission of rejected lots (lot-by-lot
          inspection)
    3.5 Manufacturing stages in a factory of an approved
          manufacturer
4 Test and measurement procedures
5 Tables for method B
Annexes
A Structural similarity rules for capability approval
B Minimum contents of a manufacturer's capability manual
    for thick film circuits
C Minimum contents of a manufacturer's capability manual
    for thin film circuits
Tables
1 Test schedule for capability approval for method A
2 Assessment levels and acceptance criteria for capability
    manual for thick film circuits
3 Assessment levels and acceptance criteria for quality
    conformance inspection for method A
4 Screening
5 Test schedule for capability approval for method B
6 Assessment levels and acceptance criteria for
    capability approval for method B
7 Assessment levels and acceptance criteria for quality
    conformance inspection for method B

Applies to film and hybrid film integrated circuits (F and HICs),manufactured as catalogue or as custom-built circuits whosequality is assessed on the basis of the capability approvalprocedure. Presents preferred values for ratings andcharacteristics, selects from the generic specificationthe appropriate tests and measuring methods and gives generalperformance requirements to be used in detailspecifications for film and hybrid film integrated circuits.