IEC 60749:1984
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Mechanical and climatic test methods.
Amended by
Available format(s)
Hardcopy , PDF
Published date
30-12-1984
Publisher
Superseded date
09-03-2020
Superseded by
€215.94
Excluding VAT
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
123
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| AS 2547.3.1-1986 | Identical |
| BS 6493-3:1985 | Identical |
| UNE 20699:1992 | Identical |
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