IEC 60749-20:2002
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
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12-09-2022
30-09-2002
Applies to semiconductor devices (discrete devices and integrated circuits) - and provides a means of assessing the resistance to soldering heat of plastic-encapsulated surface mount devices.The contents of the corrigendum of August 2003 have been included in this copy.
Committee |
TC 47
|
DocumentType |
Standard
|
Pages |
49
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
UNE-EN 60749-20:2009 | Identical |
UNE-EN 60749-20:2004 | Identical |
BS EN 60749-20:2003 | Identical |
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