IEC 61019-1-1:1990
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
02-11-2004
English - French, Russian
30-09-1990
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FOREWORD
PREFACE
SECTION 1: GENERAL INFORMATION AND STANDARD VALUES
Clause
1 Scope
2 Object
3 General terms
4 Operational properties
5 One-port resonator
6 Two-port resonator
7 Standard values
7.1 Standard nominal frequency values in megahertz
(MHz)
7.2 Standard operating temperature ranges in degrees
Celsius
7.3 Standard values of load capacitance in picofarads
(pF)
7.5 Standard levels of drive in milliwatts (mW)
7.5 Standard values of minimum insertion attenuation in
decibels (dB)
7.6 Standard values of leak rate in Pa m[3]/s
7.7 Standard climatic category
8 Marking
SECTION 2: TEST CONDITIONS
Relates to surface acoustic wave (SAW) resonators for oscillator use. Provides general information and methods concerning measurements and tests common to many types of SAW resonators. Establishes uniform conditions for assessing the mechanical, electrical and climatic properties of SAW resonators, describes test methods, gives recommendations for standard values and gives guidance on SAW resonators.
| Committee |
TC 49
|
| DocumentType |
Standard
|
| Pages |
29
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| DIN IEC 61019-1-1:1992-04 | Identical |
| PD IEC/PAS 62276:2002 | Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
| 03/108069 DC : DRAFT MAY 2003 | IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
| 13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
| IEC PAS 62276:2001 | Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
| IEC 61019-1-2:1993 | Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions |
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